Influence of Cu diffusion conditions on the switching of Cu–SiO2-based resistive memory devices SP Thermadam, SK Bhagat, TL Alford, Y Sakaguchi, MN Kozicki, ... Thin Solid Films 518 (12), 3293-3298, 2010 | 97 | 2010 |
Tungsten–titanium diffusion barriers for silver metallization S Bhagat, H Han, TL Alford Thin Solid Films 515 (4), 1998-2002, 2006 | 62 | 2006 |
Structural details of Ge‐rich and silver‐doped chalcogenide glasses for nanoionic nonvolatile memory M Mitkova, Y Sakaguchi, D Tenne, SK Bhagat, TL Alford physica status solidi (a) 207 (3), 621-626, 2010 | 45 | 2010 |
Structure of copper-doped tungsten oxide films for solid-state memory C Gopalan, MN Kozicki, S Bhagat, SCP Thermadam, TL Alford, M Mitkova Journal of non-crystalline solids 353 (18-21), 1844-1848, 2007 | 40 | 2007 |
Crystallization effects in annealed thin GeS2 films photodiffused with Ag M Balakrishnan, MN Kozicki, CD Poweleit, S Bhagat, TL Alford, M Mitkova Journal of non-crystalline solids 353 (13-15), 1454-1459, 2007 | 34 | 2007 |
Thermal stability of tungsten–titanium diffusion barriers for silver metallization SK Bhagat, ND Theodore, TL Alford Thin Solid Films 516 (21), 7451-7457, 2008 | 31 | 2008 |
Influence of Joule heating during electromigration evaluation of silver lines TL Alford, E Misra, SK Bhagat, JW Mayer Thin Solid Films 517 (5), 1833-1836, 2009 | 25 | 2009 |
Influence of defects and processing parameters on the properties of indium tin oxide films on polyethylene napthalate substrate H Han, Y Zoo, SK Bhagat, JS Lewis, TL Alford Journal of Applied Physics 102 (6), 2007 | 23 | 2007 |
Effects of deposition parameters on the electrical and mechanical properties of indium tin oxide films on polyethylene napthalate substrates deposited by radio frequency … SK Bhagat, H Han, Y Zoo, J Lewis, S Grego, K Lee, S Iyer, TL Alford Thin Solid Films 516 (12), 4064-4069, 2008 | 20 | 2008 |
Texture formation in Ag thin films: Effect of W–Ti diffusion barriers SK Bhagat, TL Alford Journal of Applied Physics 104 (10), 2008 | 7 | 2008 |
Influence of microwave annealing on direct bonded silicon wafers TL Alford, T Tang, DC Thompson, S Bhagat, JW Mayer Thin Solid Films 516 (8), 2158-2161, 2008 | 7 | 2008 |
Effect of copper addition on electromigration behavior of silver metallization S Bhagat, ND Theodore, S Chenna, T Alford Applied Physics Express 2 (9), 096502, 2009 | 6 | 2009 |
Structural study of Cu photodoped Ge-S glasses M Balakrishnan, MN Kozicki, C Poweleit, S Bhagat, TL Alford, M Mitkova Journal of Optoelectronics and Advanced Materials 9 (10), 3241, 2007 | 6 | 2007 |
Electrical and materials characterization of tungsten-titanium diffusion barrier layers and alloyed silver metallization SK Bhagat Arizona State University, 2008 | | 2008 |
A study of tungsten-titanium barriers in silver metallization S Bhagat, ND Theodore, TL Alford MRS Online Proceedings Library (OPL) 990, 0990-B08-10, 2007 | | 2007 |
Mechanical properties of indium tin oxide on polyethylene napthalate substrate S Bhagat, Y Zoo, H Han, J Lewis, S Grego, K Lee, S Iyer, TL Alford MRS Online Proceedings Library (OPL) 1012, 1012-Y12-21, 2007 | | 2007 |