John Marsland
John Marsland
Email verificata su ljmu.ac.uk
Titolo
Citata da
Citata da
Anno
Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect
JS Marsland, RC Woods, CA Brownhill
IEEE transactions on electron devices 39 (5), 1129-1135, 1992
531992
A lucky drift model, including a soft threshold energy, fitted to experimental measurements of ionization coefficients
JS Marsland
Solid-state electronics 30 (1), 125-132, 1987
501987
On the effect of ionization dead spaces on avalanche multiplication and noise for uniform electric fields
JS Marsland
Journal of applied physics 67 (4), 1929-1933, 1990
421990
On the role of astroglial syncytia in self-repairing spiking neural networks
M Naeem, LJ McDaid, J Harkin, JJ Wade, J Marsland
IEEE Transactions on Neural Networks and Learning Systems 26 (10), 2370-2380, 2015
392015
Neural network implementation using a single MOST per synapse
DE Johnson, JS Marsland, W Eccleston
IEEE transactions on neural networks 6 (4), 1008-1011, 1995
171995
Measured ionization coefficients in Ga Al As
JPR David, JS Marsland, HY Hall, G Hill, NJ Mason, MA Pate, JS Roberts, ...
Proc. 1984 Symp. GaAs Related Compounds, Inst. Phys. Conf. Ser, 247, 1985
171985
The electron impact ionization rate and breakdown voltage in GaAs/Ga/sub 0.7/Al/sub 0.3/As MQW structures
JPR David, JS Marsland, JS Roberts
IEEE electron device letters 10 (7), 294-296, 1989
121989
An RBF/MLP hybrid neural network implemented in VLSI hardware
T Yildirim, JS Marsland
Proc. Neural Networks and Their Application, 156-160, 1996
111996
Improved backpropagation training algorithm using conic section functions
T Yildirim, JS Marsland
Proceedings of International Conference on Neural Networks (ICNN'97) 2, 1078…, 1997
101997
A conic section function network synapse and neuron implementation in VLSI hardware
T Yildirim, JS Marsland
Proceedings of International Conference on Neural Networks (ICNN'96) 2, 974-979, 1996
101996
Power series approximation used in soft threshold lucky drift model of impact ionisation
JS Marsland
Semiconductor science and technology 5 (2), 177, 1990
101990
Nonlocal impact ionisation coefficients derived from Monte Carlo calculations
JS Marsland
Electronics Letters 38 (1), 55-57, 2002
92002
Temperature dependence of ionisation coefficients in silicon derived from physical model (MOSFETs)
JS Marsland
Electronics Letters 27 (22), 1997-1998, 1991
91991
As-grown-generation model for positive bias temperature instability
R Gao, Z Ji, JF Zhang, J Marsland, WD Zhang
IEEE Transactions on Electron Devices 65 (9), 3662-3668, 2018
82018
Supervised learning in spiking neural networks with limited precision: Snn/lp
E Stromatias, JS Marsland
2015 International Joint Conference on Neural Networks (IJCNN), 1-7, 2015
82015
A unified framework for connectionist models
T Yildirim, JS Marsland
4th Neural Computation and Psychology Workshop, London, 9–11 April 1997, 26-39, 1998
81998
Impact of RTN on pattern recognition accuracy of RRAM-based synaptic neural network
Z Chai, P Freitas, W Zhang, F Hatem, JF Zhang, J Marsland, B Govoreanu, ...
IEEE Electron Device Letters 39 (11), 1652-1655, 2018
72018
The Over-Reset Phenomenon in Ta2O5RRAM Device Investigated by the RTN-Based Defect Probing Technique
Z Chai, W Zhang, P Freitas, F Hatem, JF Zhang, J Marsland, B Govoreanu, ...
IEEE Electron Device Letters 39 (7), 955-958, 2018
72018
Lucky drift models of multilayered structures and approximate forms of lucky drift expressions
JS Marsland, RC Woods
IEE Proceedings J-Optoelectronics 134 (6), 313-322, 1987
71987
Evaluating the generalisation capability of a CMOS based synapse
A Ghani, L McDaid, A Belatreche, S Hall, S Huang, J Marsland, T Dowrick, ...
Neurocomputing 83, 188-197, 2012
62012
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
Articoli 1–20