John Marsland
John Marsland
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Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect
JS Marsland, RC Woods, CA Brownhill
IEEE transactions on electron devices 39 (5), 1129-1135, 1992
A lucky drift model, including a soft threshold energy, fitted to experimental measurements of ionization coefficients
JS Marsland
Solid-state electronics 30 (1), 125-132, 1987
On the effect of ionization dead spaces on avalanche multiplication and noise for uniform electric fields
JS Marsland
Journal of applied physics 67 (4), 1929-1933, 1990
On the role of astroglial syncytia in self-repairing spiking neural networks
M Naeem, LJ McDaid, J Harkin, JJ Wade, J Marsland
IEEE Transactions on Neural Networks and Learning Systems 26 (10), 2370-2380, 2015
Neural network implementation using a single MOST per synapse
DE Johnson, JS Marsland, W Eccleston
IEEE transactions on neural networks 6 (4), 1008-1011, 1995
Measured ionization coefficients in Ga Al As
JPR David, JS Marsland, HY Hall, G Hill, NJ Mason, MA Pate, JS Roberts, ...
Proc. 1984 Symp. GaAs Related Compounds, Inst. Phys. Conf. Ser, 247, 1985
The electron impact ionization rate and breakdown voltage in GaAs/Ga/sub 0.7/Al/sub 0.3/As MQW structures
JPR David, JS Marsland, JS Roberts
IEEE electron device letters 10 (7), 294-296, 1989
An RBF/MLP hybrid neural network implemented in VLSI hardware
T Yildirim, JS Marsland
Proc. Neural Networks and Their Application, 156-160, 1996
Improved backpropagation training algorithm using conic section functions
T Yildirim, JS Marsland
Proceedings of International Conference on Neural Networks (ICNN'97) 2, 1078…, 1997
A conic section function network synapse and neuron implementation in VLSI hardware
T Yildirim, JS Marsland
Proceedings of International Conference on Neural Networks (ICNN'96) 2, 974-979, 1996
Power series approximation used in soft threshold lucky drift model of impact ionisation
JS Marsland
Semiconductor science and technology 5 (2), 177, 1990
Nonlocal impact ionisation coefficients derived from Monte Carlo calculations
JS Marsland
Electronics Letters 38 (1), 55-57, 2002
Temperature dependence of ionisation coefficients in silicon derived from physical model (MOSFETs)
JS Marsland
Electronics Letters 27 (22), 1997-1998, 1991
As-grown-generation model for positive bias temperature instability
R Gao, Z Ji, JF Zhang, J Marsland, WD Zhang
IEEE Transactions on Electron Devices 65 (9), 3662-3668, 2018
Supervised learning in spiking neural networks with limited precision: Snn/lp
E Stromatias, JS Marsland
2015 International Joint Conference on Neural Networks (IJCNN), 1-7, 2015
A unified framework for connectionist models
T Yildirim, JS Marsland
4th Neural Computation and Psychology Workshop, London, 9–11 April 1997, 26-39, 1998
Impact of RTN on pattern recognition accuracy of RRAM-based synaptic neural network
Z Chai, P Freitas, W Zhang, F Hatem, JF Zhang, J Marsland, B Govoreanu, ...
IEEE Electron Device Letters 39 (11), 1652-1655, 2018
The Over-Reset Phenomenon in Ta2O5RRAM Device Investigated by the RTN-Based Defect Probing Technique
Z Chai, W Zhang, P Freitas, F Hatem, JF Zhang, J Marsland, B Govoreanu, ...
IEEE Electron Device Letters 39 (7), 955-958, 2018
Lucky drift models of multilayered structures and approximate forms of lucky drift expressions
JS Marsland, RC Woods
IEE Proceedings J-Optoelectronics 134 (6), 313-322, 1987
Evaluating the generalisation capability of a CMOS based synapse
A Ghani, L McDaid, A Belatreche, S Hall, S Huang, J Marsland, T Dowrick, ...
Neurocomputing 83, 188-197, 2012
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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