A new analytical tool for the study of radiation effects in 3-D integrated circuits: Near-zero field magnetoresistance spectroscopy JP Ashton, SJ Moxim, PM Lenahan, CG McKay, RJ Waskiewicz, KJ Myers, ...
IEEE Transactions on Nuclear Science 66 (1), 428-436, 2018
29 2018 Observation of Radiation Induced Leakage Current Defects in MOS Oxides with Multi-Frequency Electrically Detected Magnetic Resonance and Near-Zero Field Magnetoresistance SJ Moxim, JP Ashton, PM Lenahan, ME Flatté, NJ Harmon, SW King
IEEE Transactions on Nuclear Science, 2019
21 2019 Extraction of isotropic electron-nuclear hyperfine coupling constants of paramagnetic point defects from near-zero field magnetoresistance spectra via least squares fitting to … EB Frantz, NJ Harmon, SR McMillan, SJ Moxim, ME Flatté, PM Lenahan
Journal of applied physics 128 (12), 2020
20 2020 A Comparison of Radiation-Induced and High-Field Electrically Stress-Induced Interface Defects in Si/SiO₂ MOSFETs via Electrically Detected Magnetic Resonance FV Sharov, SJ Moxim, GS Haase, DR Hughart, PM Lenahan
IEEE Transactions on Nuclear Science 69 (3), 208-215, 2022
13 2022 A quantitative model for the bipolar amplification effect: A new method to determine semiconductor/oxide interface state densities JP Ashton, SJ Moxim, AD Purcell, PM Lenahan, JT Ryan
Journal of Applied Physics 130 (13), 2021
9 2021 Electrically detected magnetic resonance and near-zero field magnetoresistance in 28Si/28SiO2 EB Frantz, DJ Michalak, NJ Harmon, EM Henry, SJ Moxim, ME Flatté, ...
Journal of applied physics 130 (6), 2021
9 2021 Atomic-scale defects generated in the early/intermediate stages of dielectric breakdown in Si/SiO2 transistors SJ Moxim, FV Sharov, DR Hughart, GS Haase, CG McKay, PM Lenahan
Applied Physics Letters 120 (6), 2022
6 2022 Probing the Atomic-Scale Mechanisms of Time-Dependent Dielectric Breakdown in Si/SiO2 MOSFETs (June 2022) FV Sharov, SJ Moxim, GS Haase, DR Hughart, CG McKay, PM Lenahan
IEEE Transactions on Device and Materials Reliability 22 (3), 322-331, 2022
4 2022 Understanding the Initial Stages of Time Dependent Dielectric Breakdown in Si/SiO2 MOSFETs Utilizing EDMR and NZFMR FV Sharov, SJ Moxim, PM Lenahan, DR Hughart, GS Haase, CG McKay
2021 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2021
3 2021 Combining electrically detected magnetic resonance techniques to study atomic-scale defects generated by hot-carrier stressing in HfO2 /SiO2 /Si transistors SJ Moxim, JP Ashton, MA Anders, JT Ryan
Journal of Applied Physics 133 (14), 145702, 2023
2 2023 Spectroscopy of photoionization from the singlet state in nitrogen vacancy centers in diamond SM Blakley, TT Mai, SJ Moxim, JT Ryan, AJ Biacchi, ARH Walker, ...
arXiv preprint arXiv:2301.10383, 2023
2 2023 Near-zero-field magnetoresistance measurements: A simple method to track atomic-scale defects involved in metal-oxide-semiconductor device reliability SJ Moxim, FV Sharov, DR Hughart, GS Haase, CG McKay, EB Frantz, ...
Review of Scientific Instruments 93 (11), 2022
2 2022 Intermediate spin pair relaxation through modulation of isotropic hyperfine interaction in frequency-swept spin-dependent recombination in 4H–SiC JP Ashton, BR Manning, SJ Moxim, FV Sharov, PM Lenahan, JT Ryan
Applied Physics Letters 120 (6), 2022
2 2022 Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements S Moxim
The Pennsylvania State University, 2022
1 2022 Electrically Detected Magnetic Resonance Study of High-Field Stress Induced Si/SiO2 Interface Defects SJ Moxim, PM Lenahan, FV Sharov, GS Haase, DR Hughart
2020 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2020
1 2020 Photoionization spectroscopy of the long-lived 1 E singlet state of NV centers in diamond R McMichael, S Blakley, T Mai, S Moxim, J Ryan, A Biacchi, ...
Bulletin of the American Physical Society, 2024
2024 Understanding tunable near-zero-field magnetoresistance in Si MOSFETs S Moxim, N Harmon, K Myers, J Ashton, E Frantz, M Flatté, P Lenahan, ...
Bulletin of the American Physical Society, 2024
2024 Near zero field magnetoresistance spectroscopy in solid state electronic devices P Lenahan, E Frantz, S King, F Sharov, S Moxim, K Myers, N Harmon, ...
Spintronics XVI, PC126561U, 2023
2023 Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics PM Lenahan, EB Frantz, SW King, MA Anders, SJ Moxim, JP Ashton, ...
2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023
2023 Electrically Detected Magnetic Resonance Study of High-Field Stressing in SiOC: H Films FV Sharov, SJ Moxim, MJ Elko, SW King, PM Lenahan
2022 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2022
2022