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Arul Kumar
Arul Kumar
Deputy Director Academics, Stepping Stones Sr. Sec. School
Email verificata su steppingstoneschd.org
Titolo
Citata da
Citata da
Anno
Crystalline properties and strain relaxation mechanism of CVD grown GeSn
F Gencarelli, B Vincent, J Demeulemeester, A Vantomme, A Moussa, ...
ECS Journal of Solid State Science and Technology 2 (4), P134, 2013
1552013
Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography
AK Kambham, A Kumar, A Florakis, W Vandervorst
Nanotechnology 24 (27), 275705, 2013
452013
Ge1-xSnx Materials: Challenges and Applications
R Loo, B Vincent, F Gencarelli, C Merckling, A Kumar, G Eneman, ...
ECS Transactions 50 (9), 853, 2013
422013
Ge1-xSnx materials: Challenges and applications
R Loo, B Vincent, F Gencarelli, C Merckling, A Kumar, G Eneman, ...
ECS Journal of Solid State Science and Technology 2 (1), N35, 2012
422012
Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefacts
D Melkonyan, C Fleischmann, L Arnoldi, J Demeulemeester, A Kumar, ...
Ultramicroscopy 179, 100-107, 2017
262017
3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography
AK Kambham, A Kumar, M Gilbert, W Vandervorst
Ultramicroscopy 132, 65-69, 2013
182013
Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation
J Bogdanowicz, A Kumar, C Fleischmann, M Gilbert, J Houard, A Vella, ...
Ultramicroscopy 188, 19-23, 2018
162018
Amorphous inclusions during Ge and GeSn epitaxial growth via chemical vapor deposition
F Gencarelli, Y Shimura, A Kumar, B Vincent, A Moussa, D Vanhaeren, ...
Thin Solid Films 590, 163-169, 2015
142015
On the interplay between relaxation, defect formation, and atomic Sn distribution in Ge (1− x) Sn (x) unraveled with atom probe tomography
A Kumar, J Demeulemeester, J Bogdanowicz, J Bran, D Melkonyan, ...
Journal of Applied Physics 118 (2), 025302, 2015
142015
Atomic insight into Ge 1− x Sn x using atom probe tomography
A Kumar, MP Komalan, H Lenka, AK Kambham, M Gilbert, F Gencarelli, ...
Ultramicroscopy 132, 171-178, 2013
112013
Atomic insight into Ge {sub 1− x} Sn {sub x} using atom probe tomography
A Kumar, KU IKS, MP Komalan, H Lenka, AK Kambham, KU IKS, ...
11*2013
Atomic insight into Ge1− xSnx using atom probe tomography
A Kumar, MP Komalan, H Lenka, AK Kambham, M Gilbert, F Gencarelli, ...
Ultramicroscopy 132, 171-178, 2013
112013
Atom probe tomography for 3D-dopant analysis in FinFET devices
AK Kambham, G Zschaetzsch, Y Sasaki, M Togo, N Horiguchi, J Mody, ...
2012 Symposium on VLSI Technology (VLSIT), 77-78, 2012
92012
Measurement of the apex temperature of a nanoscale semiconducting field emitter illuminated by a femtosecond pulsed laser
A Kumar, J Bogdanowicz, J Demeulemeester, J Bran, D Melkonyan, ...
Journal of Applied Physics 124 (24), 245105, 2018
82018
On the nucleation of PdSi and NiSi2 during the ternary Ni (Pd)/Si (100) reaction
A Schrauwen, J Demeulemeester, A Kumar, W Vandervorst, CM Comrie, ...
Journal of Applied Physics 114 (6), 063518, 2013
62013
Progress in i-Module: Towards improved performance, reliability and module-level fabrication technologies for back-contact PV modules based on ultra-thin silicon solar cells
J Govaerts, R Labie, SN Granata, M Gonzalez, B O'Sullivan, ...
26th European Photovoltaic Solar Energy Conference and Exhibition-EU PVSEC …, 2011
62011
Qualitative and Quantitative analysis of compound semiconductors using Atom Probe Tomogaphy
A Kumar
32016
Method for heterojunction interface passivation
A Kumar, T Bearda, A Gougam
US Patent WO/2012/08 515, 529, 2012
22012
Emitter shape evolution during field evaporation and its impact on the reconstructed data of SiGe fins embedded in SiO2
D Melkonyan, L Arnoldi, C Fleischmann, A Kumar, F Vurpillot, ...
APT&M, Date: 2016/01/01-2016/01/06, Location: Gyeongju Korea, 2016
12016
Study of Sn migration during relaxation of Ge {sub 1-x} Sn {sub x} layers using atom probe tomography
A Kumar, F Gencarelli, AK Kambham, W Vandervorst, KU IKS, M Gilbert, ...
1*2012
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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