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Etienne Sicard
Etienne Sicard
Professor, electronics & computer engineering
Email verificata su insa-toulouse.fr - Home page
Titolo
Citata da
Citata da
Anno
The electromagnetic compatibility of integrated circuits—Past, present, and future
M Ramdani, E Sicard, A Boyer, SB Dhia, JJ Whalen, TH Hubing, ...
IEEE Transactions on Electromagnetic Compatibility 51 (1), 78-100, 2009
3792009
Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility
S Ben Dhia, M Ramdani, E Sicard
Springer Science & Business Media, 2006
3622006
The challenge of signal integrity in deep-submicrometer CMOS technology
F Caignet, S Ben Dhia, E Sicard
Proceedings of the IEEE 89 (4), 556-573, 2001
1992001
Basics of CMOS cell design
E Sicard, S Ben Dhia
Tata McGraw-Hill Education, 2005
1072005
Modeling the electromagnetic emission of a microcontroller using a single model
C Labussière-Dorgan, S Ben Dhia, E Sicard, J Tao, HJ Quaresma, ...
Electromagnetic Compatibility, IEEE Transactions on 50 (1), 22-34, 2008
1012008
Introducing 5-nm FinFET technology in Microwind
E Sicard, L Trojman
732021
Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan
A Boyer, S Ben Dhia, E Sicard
Electronics Letters 43 (1), 15-16, 2007
722007
Advanced CMOS cell design
E Sicard, S Ben Dhia
Tata McGraw-Hill Education, 2007
632007
Characterization and modeling of parasitic emission in deep submicron CMOS
B Vrignon, S Delmas Ben Dhia, E Lamoureux, E Sicard
Electromagnetic Compatibility, IEEE Transactions on 47 (2), 382-387, 2005
612005
Near-field mapping system to scan in time domain the magnetic emissions of integrated circuits
T Ordas, M Lisart, E Sicard, P Maurine, L Torres
Integrated Circuit and System Design. Power and Timing Modeling …, 2009
592009
Effective teaching of the physical design of integrated circuits using educational tools
SM Aziz, E Sicard, SB Dhia
IEEE Transactions on Education 53 (4), 517-531, 2009
532009
Microwind & Dsch: Version 3
E Sicard, SB Dhia
INSA, 2004
46*2004
Introducing 65 nm technology in Microwind3
E Sicard, SM Aziz
442011
Modeling and simulation of LDO voltage regulator susceptibility to conducted EMI
J Wu, A Boyer, J Li, B Vrignon, SB Dhia, E Sicard, R Shen
IEEE Transactions on Electromagnetic Compatibility 56 (3), 726-735, 2014
422014
Analysis of crosstalk interference in CMOS integrated circuits
E Sicard, A Rubio
IEEE transactions on electromagnetic compatibility 34 (2), 124-129, 1992
421992
Modelling of a direct power injection aggression on a 16 bit microcontroller input buffer
A Boyer, S Ben Dhia, E Sicard
EMC Compo 2007 - Torino, 27-30/11/2007, 35-39, 2007
37*2007
Characterisation of microcontroller susceptibility to radio frequency interference
S Baffreau, S Ben Dhia, M Ramdani, E Sicard
Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE …, 2002
352002
On-chip sampling in CMOS integrated circuits
S Delmas-Bendhia, F Caignet, E Sicard, M Roca
IEEE Transactions on Electromagnetic Compatibility 41 (4), 403-406, 1999
351999
Towards an EMC roadmap for Integrated Circuits
S Ben Dhia, M Ramdani, E Sicard
2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th …, 2008
30*2008
Electromagnetic near-field scanning for microelectronic test chip investigation
A Tankielun, U Keller, E Sicard, P Kralicek, B Vrignon
IEEE EMC society newsletter 68, 2006
282006
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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