Crea il mio profilo
Accesso pubblico
Visualizza tutto63 articoli
15 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
Pradeep RohatgiProfessor of Materials Engineering, University of Wisconsin MilwaukeeEmail verificata su uwm.edu
Vasanth Chakravarthy ShunmugasamyTexas A&M University at QatarEmail verificata su nyu.edu
Mrityunjay DoddamaniAssociate Professor, SMME, Indian Institute of Technology MandiEmail verificata su iitmandi.ac.in
Maurizio PorfiriInstitute Professor, Tandon School of Engineering, New York UniversityEmail verificata su nyu.edu
Steven Eric ZeltmannUC Berkeley/National Center for Electron MicroscopyEmail verificata su nyu.edu
Dũng (Dzung) Dinh LuongIndustry Assistant Professor, New York UniversityEmail verificata su nyu.edu
Paulo G. Coelho, MD, DDS, PhDPlastic Surgery - University of Miami School of Medicine DeWitt Daughtry Family Dept. of SurgeryEmail verificata su med.miami.edu
Ramesh Karri కర్రి రమేష్Professor of Electrical and Computer Engineering, New York UniversityEmail verificata su nyu.edu
Oliver StrbikDeep Springs TechnologyEmail verificata su teamdst.com
Chongchen XiangSoochow UniversityEmail verificata su suda.edu.cn
Ashish Kumar SinghNew York UniversityEmail verificata su nyu.edu
Kaushik Yanamandra Ph.D.Application Development Engineer at Carl ZeissEmail verificata su zeiss.com
Fei ChenNew York UniversityEmail verificata su nyu.edu
Gabriele TagliaviaNYU, Tandon School of EngineeringEmail verificata su nyu.edu
Xianbo XuNew York UniversityEmail verificata su nyu.edu
Gary MacNYU Tandon School of EngineeringEmail verificata su nyu.edu
Nektarios Georgios TsoutsosAssistant Professor, University of DelawareEmail verificata su udel.edu
Rahul MaharsiaTrelleborg Offshore US Inc.Email verificata su trelleborg.com
Rakesh K BeheraIndustry Assistant ProfessorEmail verificata su ufl.edu
Dirk LehmhusSenior Researcher, Fraunhofer IFAM - Fraunhofer Institute for Manufacturing Technology and AdvancedEmail verificata su uni-bremen.de
Segui
Nikhil Gupta, FASM
New York University, Tandon School of Engineering
Email verificata su nyu.edu - Home page