Shape changes of supported Rh nanoparticles during oxidation and reduction cycles P Nolte, A Stierle, NY Jin-Phillipp, N Kasper, TU Schulli, H Dosch
Science 321 (5896), 1654-1658, 2008
205 2008 Direct determination of strain and composition profiles in SiGe islands by anomalous x-ray diffraction at high momentum transfer TU Schülli, J Stangl, Z Zhong, RT Lechner, M Sztucki, TH Metzger, ...
Physical review letters 90 (6), 066105, 2003
152 2003 Substrate-enhanced supercooling in AuSi eutectic droplets TU Schülli, R Daudin, G Renaud, A Vaysset, O Geaymond, A Pasturel
Nature 464 (7292), 1174, 2010
107 2010 Enhanced relaxation and intermixing in Ge islands grown on pit-patterned Si (001) substrates TU Schülli, G Vastola, MI Richard, A Malachias, G Renaud, F Uhlík, ...
Physical review letters 102 (2), 025502, 2009
94 2009 Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping GA Chahine, MI Richard, RA Homs-Regojo, TN Tran-Caliste, D Carbone, ...
Journal of Applied Crystallography 47 (2), 762-769, 2014
70 2014 Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si (001) determined by anomalous x-ray diffraction and reciprocal space mapping TU Schülli, M Stoffel, A Hesse, J Stangl, RT Lechner, E Wintersberger, ...
Physical Review B 71 (3), 035326, 2005
70 2005 Strain distribution in nitride quantum dot multilayers V Chamard, T Schülli, M Sztucki, TH Metzger, E Sarigiannidou, ...
Physical Review B 69 (12), 125327, 2004
59 2004 Surface phase transitions in BiFeO R Jarrier, X Marti, J Herrero-Albillos, P Ferrer, R Haumont, P Gemeiner, ...
Physical Review B 85 (18), 184104, 2012
53 2012 X-ray study of atomic ordering in self-assembled Ge islands grown on Si (001) A Malachias, TU Schülli, G Medeiros-Ribeiro, LG Cançado, M Stoffel, ...
Physical Review B 72 (16), 165315, 2005
51 2005 X-ray diffraction from rectangular slits L Bolloc'h, F Livet, F Bley, T Schulli, M Veron, TH Metzger
Journal of Synchrotron Radiation 9 (4), 258-265, 2002
48 2002 Intergrowth Structure and Aluminium Zoning of a Zeolite ZSM‐5 Crystal as Resolved by Synchrotron‐Based Micro X‐Ray Diffraction Imaging Z Ristanović, JP Hofmann, U Deka, TU Schülli, M Rohnke, AM Beale, ...
Angewandte Chemie International Edition 52 (50), 13382-13386, 2013
42 2013 Inversion domain boundaries in GaN wires revealed by coherent bragg imaging S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
39 2015 Anomalous x-ray diffraction on InAs/GaAs quantum dot systems TU Schülli, M Sztucki, V Chamard, TH Metzger, D Schuh
Applied physics letters 81 (3), 448-450, 2002
38 2002 Strain Induced Changes in the Magnetic Phase Diagram of Metamagnetic Heteroepitaxial RT Lechner, G Springholz, TU Schülli, J Stangl, T Schwarzl, G Bauer
Physical review letters 94 (15), 157201, 2005
37 2005 Structural investigation of silicon nanowires using GIXD and GISAXS: Evidence of complex saw-tooth faceting T David, D Buttard, T Schülli, F Dallhuin, P Gentile
Surface Science 602 (15), 2675-2680, 2008
36 2008 Crystal phase transitions in the shell of PbS/CdS core/shell nanocrystals influences photoluminescence intensity RT Lechner, G Fritz-Popovski, M Yarema, W Heiss, A Hoell, TU Schülli, ...
Chemistry of Materials 26 (20), 5914-5922, 2014
31 2014 Fully coherent growth of Ge on free-standing Si (001) nanomesas F Montalenti, M Salvalaglio, A Marzegalli, P Zaumseil, G Capellini, ...
Physical Review B 89 (1), 014101, 2014
29 2014 Correlation of electrical and structural properties of single as-grown GaAs nanowires on Si (111) substrates G Bussone, H Schäfer-Eberwein, E Dimakis, A Biermanns, D Carbone, ...
Nano letters 15 (2), 981-989, 2015
28 2015 Unit cell structure of the wurtzite phase of GaP nanowires: X-ray diffraction studies and density functional theory calculations D Kriegner, S Assali, A Belabbes, T Etzelstorfer, V Holı, T Schülli, ...
Physical Review B 88 (11), 115315, 2013
28 2013 Application of a single-reflection collimating multilayer optic for X-ray diffraction experiments employing parallel-beam geometry M Wohlschlögel, TU Schülli, B Lantz, U Welzel
Journal of Applied Crystallography 41 (1), 124-133, 2008
28 2008 