Tobias Schülli
Tobias Schülli
ESRF Scientist in charge of Beamline ID01; Group Head of the X-ray Nanoprobe group
Email verificata su esrf.fr - Home page
TitoloCitata daAnno
Shape changes of supported Rh nanoparticles during oxidation and reduction cycles
P Nolte, A Stierle, NY Jin-Phillipp, N Kasper, TU Schulli, H Dosch
Science 321 (5896), 1654-1658, 2008
2052008
Direct determination of strain and composition profiles in SiGe islands by anomalous x-ray diffraction at high momentum transfer
TU Schülli, J Stangl, Z Zhong, RT Lechner, M Sztucki, TH Metzger, ...
Physical review letters 90 (6), 066105, 2003
1522003
Substrate-enhanced supercooling in AuSi eutectic droplets
TU Schülli, R Daudin, G Renaud, A Vaysset, O Geaymond, A Pasturel
Nature 464 (7292), 1174, 2010
1072010
Enhanced relaxation and intermixing in Ge islands grown on pit-patterned Si (001) substrates
TU Schülli, G Vastola, MI Richard, A Malachias, G Renaud, F Uhlík, ...
Physical review letters 102 (2), 025502, 2009
942009
Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping
GA Chahine, MI Richard, RA Homs-Regojo, TN Tran-Caliste, D Carbone, ...
Journal of Applied Crystallography 47 (2), 762-769, 2014
702014
Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si (001) determined by anomalous x-ray diffraction and reciprocal space mapping
TU Schülli, M Stoffel, A Hesse, J Stangl, RT Lechner, E Wintersberger, ...
Physical Review B 71 (3), 035326, 2005
702005
Strain distribution in nitride quantum dot multilayers
V Chamard, T Schülli, M Sztucki, TH Metzger, E Sarigiannidou, ...
Physical Review B 69 (12), 125327, 2004
592004
Surface phase transitions in BiFeO below room temperature
R Jarrier, X Marti, J Herrero-Albillos, P Ferrer, R Haumont, P Gemeiner, ...
Physical Review B 85 (18), 184104, 2012
532012
X-ray study of atomic ordering in self-assembled Ge islands grown on Si (001)
A Malachias, TU Schülli, G Medeiros-Ribeiro, LG Cançado, M Stoffel, ...
Physical Review B 72 (16), 165315, 2005
512005
X-ray diffraction from rectangular slits
L Bolloc'h, F Livet, F Bley, T Schulli, M Veron, TH Metzger
Journal of Synchrotron Radiation 9 (4), 258-265, 2002
482002
Intergrowth Structure and Aluminium Zoning of a Zeolite ZSM‐5 Crystal as Resolved by Synchrotron‐Based Micro X‐Ray Diffraction Imaging
Z Ristanović, JP Hofmann, U Deka, TU Schülli, M Rohnke, AM Beale, ...
Angewandte Chemie International Edition 52 (50), 13382-13386, 2013
422013
Inversion domain boundaries in GaN wires revealed by coherent bragg imaging
S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ...
ACS nano 9 (9), 9210-9216, 2015
392015
Anomalous x-ray diffraction on InAs/GaAs quantum dot systems
TU Schülli, M Sztucki, V Chamard, TH Metzger, D Schuh
Applied physics letters 81 (3), 448-450, 2002
382002
Strain Induced Changes in the Magnetic Phase Diagram of Metamagnetic Heteroepitaxial Multilayers
RT Lechner, G Springholz, TU Schülli, J Stangl, T Schwarzl, G Bauer
Physical review letters 94 (15), 157201, 2005
372005
Structural investigation of silicon nanowires using GIXD and GISAXS: Evidence of complex saw-tooth faceting
T David, D Buttard, T Schülli, F Dallhuin, P Gentile
Surface Science 602 (15), 2675-2680, 2008
362008
Crystal phase transitions in the shell of PbS/CdS core/shell nanocrystals influences photoluminescence intensity
RT Lechner, G Fritz-Popovski, M Yarema, W Heiss, A Hoell, TU Schülli, ...
Chemistry of Materials 26 (20), 5914-5922, 2014
312014
Fully coherent growth of Ge on free-standing Si (001) nanomesas
F Montalenti, M Salvalaglio, A Marzegalli, P Zaumseil, G Capellini, ...
Physical Review B 89 (1), 014101, 2014
292014
Correlation of electrical and structural properties of single as-grown GaAs nanowires on Si (111) substrates
G Bussone, H Schäfer-Eberwein, E Dimakis, A Biermanns, D Carbone, ...
Nano letters 15 (2), 981-989, 2015
282015
Unit cell structure of the wurtzite phase of GaP nanowires: X-ray diffraction studies and density functional theory calculations
D Kriegner, S Assali, A Belabbes, T Etzelstorfer, V Holı, T Schülli, ...
Physical Review B 88 (11), 115315, 2013
282013
Application of a single-reflection collimating multilayer optic for X-ray diffraction experiments employing parallel-beam geometry
M Wohlschlögel, TU Schülli, B Lantz, U Welzel
Journal of Applied Crystallography 41 (1), 124-133, 2008
282008
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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