Random addressable 2048/spl times/2048 active pixel image sensor D Scheffer, B Dierickx, G Meynants IEEE Transactions on Electron Devices 44 (10), 1716-1720, 1997 | 175 | 1997 |
Total dose and displacement damage effects in a radiation-hardened CMOS APS J Bogaerts, B Dierickx, G Meynants, D Uwaerts IEEE Transactions on electron devices 50 (1), 84-90, 2003 | 166 | 2003 |
Time-delay-integration architectures in CMOS image sensors G Lepage, J Bogaerts, G Meynants IEEE Transactions on Electron Devices 56 (11), 2524-2533, 2009 | 124 | 2009 |
Near 100% fill factor CMOS active pixels B Dierickx, G Meynants, D Scheffer Proc. IEEE CCD & AIS workshop, P1-P1, 1997 | 108 | 1997 |
Random addressable active pixel image sensors B Dierickx, D Scheffer, G Meynants, W Ogiers, J Vlummens Advanced Focal Plane Arrays and Electronic Cameras 2950, 2-7, 1996 | 97 | 1996 |
CMOS active pixel image sensor with CCD performance G Meynants, B Dierickx, D Scheffer Advanced Focal Plane Arrays and Electronic Cameras II 3410, 68-76, 1998 | 94 | 1998 |
Pixel structure with multiple transfer gates X Wang, G Meynants, B Wolfs US Patent 9,001,245, 2015 | 85 | 2015 |
Pixel array capable of performing pipelined global shutter operation including a first and second buffer amplifier G Meynants, J Bogaerts US Patent 8,569,671, 2013 | 65 | 2013 |
Missing pixel correction algorithm for image sensors B Dierickx, G Meynants Advanced Focal Plane Arrays and Electronic Cameras II 3410, 200-203, 1998 | 44 | 1998 |
Backside illuminated global shutter CMOS image sensors G Meynants, J Bogaerts, X Wang, G Vanhorebeek IEEE Int. Image Sensor Workshop, 305-308, 2011 | 42 | 2011 |
Near-100% fill factor standard CMOS active pixel B Dierickx, G Meynants, D Scheffer proc. 1997 CCD & AIS workshop P 1, 1997 | 39 | 1997 |
A 2.2 M CMOS image sensor for high-speed machine vision applications X Wang, J Bogaerts, G Vanhorebeek, K Ruythoren, B Ceulemans, ... Sensors, Cameras, and Systems for Industrial/Scientific Applications XI 7536 …, 2010 | 38 | 2010 |
Low-power lock-in amplifier for complex impedance measurement J Xu, G Meynants, P Merken 2009 3rd International Workshop on Advances in sensors and Interfaces, 110-114, 2009 | 36 | 2009 |
Pixel array G Meynants US Patent 9,231,005, 2016 | 31 | 2016 |
High speed 36 Gbps 12Mpixel global pipelined shutter CMOS image sensor with CDS J Bogaerts IISW, 2011, 335-338, 2011 | 30 | 2011 |
Pixel binning in CMOS image sensors G Meynants, J Bogaerts Frontiers in Electronic Imaging Conference, 2009 | 27 | 2009 |
Irradiation damage tests on backside-illuminated CMOS APS prototypes for the extreme ultraviolet imager on-board solar orbiter A BenMoussa, S Gissot, B Giordanengo, G Meynants, X Wang, B Wolfs, ... IEEE Transactions on Nuclear Science 60 (5), 3907-3914, 2013 | 26 | 2013 |
Limitations to the frame rate of high speed image sensors G Meynants, G Lepage, J Bogaerts, G Vanhorebeek, X Wang Proc. Int. Image Sensor Workshop, 153-156, 2009 | 25 | 2009 |
A 35 mm 13.89 Million pixel CMOS active pixel image sensor G Meynants, B Dierickx, A Alaerts, D Uwaerts, S Cos, S Noble PICS, 58-61, 2003 | 23 | 2003 |
Measuring intra-pixel sensitivity variations of a CMOS image sensor SB Mahato, J De Ridder, G Meynants, G Raskin, H Van Winckel IEEE Sensors Journal 18 (7), 2722-2728, 2018 | 22 | 2018 |