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Peter Roediger
Peter Roediger
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Sample size effects on the transport characteristics of mesoscopic graphite samples
J Barzola‐Quiquia, JL Yao, P Rödiger, K Schindler, P Esquinazi
physica status solidi (a) 205 (12), 2924-2933, 2008
772008
Transport properties and growth parameters of PdC and WC nanowires prepared in a dual-beam microscope
D Spoddig, K Schindler, P Rödiger, J Barzola-Quiquia, K Fritsch, ...
Nanotechnology 18 (49), 495202, 2007
742007
Indications for intrinsic superconductivity in highly oriented pyrolytic graphite
P Esquinazi, N García, J Barzola-Quiquia, P Rödiger, K Schindler, JL Yao, ...
Physical Review B 78 (13), 134516, 2008
622008
Focused-ion-beam-inflicted surface amorphization and gallium implantation—new insights and removal by focused-electron-beam-induced etching
P Roediger, HD Wanzenboeck, S Waid, G Hochleitner, E Bertagnolli
Nanotechnology 22 (23), 235302, 2011
372011
Evaluation of chamber contamination in a scanning electron microscope
P Rödiger, HD Wanzenboeck, G Hochleitner, E Bertagnolli
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
312009
Novel method for cleaning a vacuum chamber from hydrocarbon contamination
HD Wanzenboeck, P Roediger, G Hochleitner, E Bertagnolli, W Buehler
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 28 (6 …, 2010
272010
Method for fabrication of high aspect ratio trenches and formation of nanoscale features therefrom
RC Dynes, P Roediger, T Wong, SA Cybart
US Patent 9,653,309, 2017
252017
Focused electron beam induced etching of silicon using chlorine
P Roediger, G Hochleitner, E Bertagnolli, HD Wanzenboeck, W Buehler
Nanotechnology 21 (28), 285306, 2010
242010
Temporal stability of Y–Ba–Cu–O nano josephson junctions from ion irradiation
SA Cybart, P Roediger, K Chen, JM Parker, EY Cho, TJ Wong, RC Dynes
IEEE transactions on applied superconductivity 23 (3), 1100103-1100103, 2012
232012
Focused electron beam induced deposition of gold catalyst templates for Si-nanowire synthesis
G Hochleitner, M Steinmair, A Lugstein, P Roediger, HD Wanzenboeck, ...
Nanotechnology 22 (1), 015302, 2010
162010
Nanometer scale high-aspect-ratio trench etching at controllable angles using ballistic reactive ion etching
SA Cybart, P Roediger, E Ulin-Avila, SM Wu, TJ Wong, RC Dynes
Journal of Vacuum Science & Technology B 31 (1), 2013
152013
Particle beam microscopy system and method for operating the same
W Buehler, H Doemer, M Lang, J Stodolka, P Roediger, E Bertagnolli, ...
US Patent 8,507,854, 2013
102013
Fabrication of Arrays of Nano-Superconducting Quantum Interference Devices Using a Double-Angle Processing Approach
P Roediger, SA Cybart, RC Dynes
IEEE transactions on applied superconductivity 23 (3), 1100604-1100604, 2012
82012
Focused electron beam induced etching of silicon by chlorine gas: Negative effects of residual gas contamination on the etching process
P Roediger, HD Wanzenboeck, G Hochleitner, E Bertagnolli, W Buehler
Journal of Applied Physics 108 (12), 2010
62010
Crystallinity-retaining removal of germanium by direct-write focused electron beam induced etching
P Roediger, HD Wanzenboeck, G Hochleitner, E Bertagnolli
Journal of Vacuum Science & Technology B 29 (4), 2011
52011
Andreev Oscillations in Normal-Superconducting-Normal Nanostructures
P Rödiger, P Esquinazi, N García
Journal of superconductivity and novel magnetism 22, 331-335, 2009
42009
Local, direct-write, damage-free thinning of germanium nanowires
P Roediger, M Mijic, C Zeiner, A Lugstein, HD Wanzenboeck, ...
Journal of Vacuum Science & Technology B 29 (6), 2011
12011
Focused Electron Beam Induced Etching-Advantages, Features & Limitations of FEBIE with Chlorine
HD Wanzenböck, MM Shawrav, J Mika, S Waid, ZG Gökdeniz, P Rödiger, ...
Programme, 1-2, 2015
2015
Surface doping of Germanium Nanowires
C Zeiner, A Lugstein, P Rödiger, M Mijic, M den Hertog, A Prager, ...
2013
Engineering electrical properties of Silicon nanowires by focused electron beam induced processing with Chlorine
HD Wanzenböck, B Ismail, P Rödiger, JM Greil, M Hetzel, A Lugstein, ...
2012
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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