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- Felix Meliformer head of length, nano- and microtechnologyEmail verificata su metas.ch
- Diego F GroszGrupo de Comunicaciones Ópticas, Depto. de Ing. en Telecomunicaciones, Centro Atómico BarilocheEmail verificata su ib.edu.ar
- Anjali AgarwalLGS InnovationsEmail verificata su caci.com
- Rudolf ThalmannHead of sector, Federal Institute of Metrology METASEmail verificata su metas.ch
- Luc ThévenazProfessor at EPFL Ecole Polytechnique Fédérale de Lausanne, School of Engineering, Institute ofEmail verificata su epfl.ch
- Juerg LeutholdInstitute of Electromagnetic Fields (IEF), ETH Zurich, Zurich, SwitzerlandEmail verificata su ethz.ch
- Sethumadhavan ChandrasekharRetired Nokia Bell LabsEmail verificata su ieee.org
- Xiang LiuHuawei TechnologiesEmail verificata su ieee.org
- Chris XuIBM Chair Professor of Applied and Engineering Physics, Cornell UniversityEmail verificata su cornell.edu
- Christopher DoerrAcacia CommunicationsEmail verificata su acacia-inc.com
- A.M. IonescuProfessor of NanoelectronicsEmail verificata su epfl.ch