| Test, reliability and functional safety trends for automotive system-on-chip F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ... 2022 IEEE European Test Symposium (ETS), 1-10, 2022 | 8 | 2022 |
| A novel SEU injection setup for Automotive SoC G Iaria, T Foscale, P Bernardi, L Presicce, MS Reorda, D Appello, ... 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE), 623-626, 2022 | 2 | 2022 |
| In-field data collection system through logic bist for large automotive systems-on-chip G Filipponi, G Iaria, MS Reorda, D Appello, G Garozzo, V Tancorre 2022 IEEE International Test Conference (ITC), 646-649, 2022 | 1 | 2022 |
| A novel pattern selection algorithm to reduce the test cost of large automotive systems-on-chip G Iaria, F Angione, P Bernardi, MS Reorda, D Appello, G Garozzo, ... 2022 IEEE 23rd Latin American Test Symposium (LATS), 1-6, 2022 | 1 | 2022 |
| About the correlation between logical identified faulty gates and their layout characteristics P Bernardi, L Cardone, G Iaria, D Appello, G Garozzo, V Tancorre 2023 IEEE 29th International Symposium on On-Line Testing and Robust System …, 2023 | | 2023 |
| PFS-Strategies and Evaluation Methods to reach Ultra-Reliability in Automotive Systems-on-Chip G Iaria | | 2022 |
| SP2-Test, Reliability and Functional Safety Trends for Automotive System-on-Chip F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ... | | 2022 |
| Quantum Machine Learning for Image Classification G Iaria Politecnico di Torino, 2021 | | 2021 |
Francesco AngionePolitecnico di TorinoVerified email at polito.it
