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- Byoung Hun LeePohang University of Science and TechnologyEmail verificata su postech.ac.kr
- prashant majhiIntel Corp.Email verificata su intel.com
- Huang-Chun WenTexas InstrumentsEmail verificata su ti.com
- Takashi AndoIBM T. J. Watson Research CenterEmail verificata su us.ibm.com
- Husam N AlshareefKAUST, Saudi Arabia; Univeristy of Texas at Dallas (Adjunct)Email verificata su kaust.edu.sa
- RUILONG XIEIBMEmail verificata su ibm.com
- Eduard A CartierIBM Research, T. J. Watson Research CenterEmail verificata su us.ibm.com
- Hoon KimCorning Incorporated,Email verificata su corning.com
- Nicholas A. LanzilloIBMEmail verificata su us.ibm.com
- V. NarayananIBM T. J. Watson Research CenterEmail verificata su us.ibm.com
- Rino ChoiProfessor of Materials Science and Eng., Inha UniversityEmail verificata su inha.ac.kr
- Brent AndersonSenior Staff Engineer at IBMEmail verificata su us.ibm.com
- Sergey NikishinProfessor of Electrical Engineering, Texas Tech UniversityEmail verificata su ttu.edu
- L.A. ClevengerIBM ResearchEmail verificata su us.ibm.com
- Robert R RobisonIBM ResearchEmail verificata su us.ibm.com
- Changhwan ChoiHanyang University, Materials Science and EngineeringEmail verificata su hanyang.ac.kr
- Martin M. FrankIBM ResearchEmail verificata su us.ibm.com
- Manuel Quevedo-lopezUniversity of Texas at DallasEmail verificata su utdallas.edu
- Chadwin D. YoungUniversity of Texas at DallasEmail verificata su utdallas.edu
- Barry P. LinderResearch Staff Member, IBMEmail verificata su us.ibm.com