| Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon IEEE Transactions on Software Engineering, 1-1, 2014 | 192 | 2014 |
| Trivial compiler equivalence: A large scale empirical study of a simple, fast and effective equivalent mutant detection technique M Papadakis, Y Jia, M Harman, Y Le Traon 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 147 | 2015 |
| Combining Multi-Objective Search and Constraint Solving for Configuring Large Software Product Lines C Henard, M Papadakis, M Harman, Y Le Traon 37th International Conference on Software Engineering (ICSE), 2015 | 139 | 2015 |
| Static analysis of android apps: A systematic literature review L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ... Information and Software Technology 88, 67-95, 2017 | 135 | 2017 |
| Metallaxis‐FL: mutation‐based fault localization M Papadakis, Y Le Traon Software Testing, Verification and Reliability 25 (5-7), 605-628, 2015 | 122 | 2015 |
| Multi-objective test generation for software product lines C Henard, M Papadakis, G Perrouin, J Klein, YL Traon Proceedings of the 17th International Software Product Line Conference, 62-71, 2013 | 115 | 2013 |
| Mutation testing advances: an analysis and survey M Papadakis, M Kintis, J Zhang, Y Jia, Y Le Traon, M Harman Advances in Computers 112, 275-378, 2019 | 109 | 2019 |
| Comparing White-box and Black-box Test Prioritization C Henard, M Papadakis, M Harman, Y Jia, Y Le Traon ICSE, 2016 | 108 | 2016 |
| Automatic mutation test case generation via dynamic symbolic execution M Papadakis, N Malevris 2010 IEEE 21st International Symposium on Software Reliability Engineering …, 2010 | 108 | 2010 |
| An empirical evaluation of the first and second order mutation testing strategies M Papadakis, N Malevris 2010 Third International Conference on Software Testing, Verification, and …, 2010 | 90 | 2010 |
| PIT a Practical Mutation Testing Tool for Java (Demo) H Coles, T Laurent, C Henard, M Papadakis, A Ventresque International Symposium on Software Testing and Analysis (ISSTA …, 2016 | 76* | 2016 |
| Evaluating mutation testing alternatives: A collateral experiment M Kintis, M Papadakis, N Malevris 2010 Asia Pacific Software Engineering Conference, 300-309, 2010 | 76 | 2010 |
| Threats to the validity of mutation-based test assessment M Papadakis, C Henard, M Harman, Y Jia, Y Le Traon Proceedings of the 25th International Symposium on Software Testing and …, 2016 | 70 | 2016 |
| An empirical study on mutation, statement and branch coverage fault revelation that avoids the unreliable clean program assumption TT Chekam, M Papadakis, Y Le Traon, M Harman 2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE …, 2017 | 69 | 2017 |
| Assessing Software Product Line Testing via Model-based Mutation: An Application to Similarity Testing C Henard, M Papadakis, G Perrouin, J Klein, Y Le Traon | 69 | 2013 |
| Mutation based test case generation via a path selection strategy M Papadakis, N Malevris Information and Software Technology 54 (9), 915-932, 2012 | 67 | 2012 |
| Using mutants to locate" unknown" faults M Papadakis, Y Le Traon 2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012 | 63 | 2012 |
| Automatically performing weak mutation with the aid of symbolic execution, concolic testing and search-based testing M Papadakis, N Malevris Software Quality Journal 19 (4), 691-723, 2011 | 63 | 2011 |
| Featured Model-based Mutation Analysis X Devroey, G Perrouin, M Papadakis, A Legay, PY Schobbens, ... ICSE, 2016 | 47 | 2016 |
| Isolating first order equivalent mutants via second order mutation M Kintis, M Papadakis, N Malevris 2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012 | 47 | 2012 |
Yves Le TraonProfessor of Computer Science, University of LuxembourgEmail verificata su uni.lu
