Crea il mio profilo
Coautori
IAN F. AKYILDIZGeorgia Institute of Technology, School of Electrical and Computer EngineeringEmail verificata su ece.gatech.edu
Ravikumar BalakrishnanIntel CorporationEmail verificata su intel.com
Konstantinos ManolakisSenior Research and Standards Engineer, Nokia Bell LabsEmail verificata su nokia.com
Volker JungnickelFraunhofer Heinrich Hertz Institute (HHI)Email verificata su hhi.fraunhofer.de
Wen XuHuaweiEmail verificata su ieee.org
ÖMER BULAKCINokia Bell LabsEmail verificata su ieee.org
Hassan ArtailAmerican University of BeirutEmail verificata su aub.edu.lb
Emmanouil PateromichelakisLenovo GermanyEmail verificata su lenovo.com
John Robert KrierCardlyticsEmail verificata su cardlytics.com
Joerg WidmerResearch Professor, IMDEA Networks, Madrid, SpainEmail verificata su imdea.org
Vicent PlaUniversitat Politècnica de ValènciaEmail verificata su upv.es
Berk CanberkAssociate Prof. in Istanbul Technical University, Adjunct Associate Prof. in Northeastern UniversityEmail verificata su northeastern.edu
Pablo AmeigeirasUniversidad de GranadaEmail verificata su ugr.es
Jorge Navarro OrtizAssociate professor, University of GranadaEmail verificata su ugr.es
David M. Gutierrez-Estevez
Principal Research/Standards Engineer, Samsung R&D Institute UK
Email verificata su samsung.com - Home page