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- Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Robert A ReedVanderbilt UniversityEmail verificata su vanderbilt.edu
- Arthur WitulskiResearch Professor Electrical Engineering, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- Andrew SternbergVanderbilt UniversityEmail verificata su vanderbilt.edu
- Arto JavanainenJyväskylä UniversityEmail verificata su jyu.fi
- Enxia ZhangUniversity of Central FloridaEmail verificata su ucf.edu
- Michael AllesVanderbilt UniversityEmail verificata su vanderbilt.edu
- Lloyd MassengillVanderbilt UniversityEmail verificata su vanderbilt.edu
- C. ClaeysProfessor KU LeuvenEmail verificata su kuleuven.be
- Bo Kyoung ChoiMTEGEmail verificata su mteg.co.kr
- Robert A. WellerVanderbilt UniversityEmail verificata su vanderbilt.edu
- Steven KosierVanderbilt UniversityEmail verificata su Vanderbilt.edu
- Brian SierawskiResearch Associate Professor, Vanderbilt UniversityEmail verificata su vanderbilt.edu
- jerome bochmontpellier universityEmail verificata su umontpellier.fr
- Chaoming LiuHarbin Institute of TechnologyEmail verificata su hit.edu.cn
- Ari VirtanenUniversity of JyväskyläEmail verificata su jyu.fi
- Dale P. McMorrowNaval Research LaboratoryEmail verificata su nrl.navy.mil
- Dunbar P. Birnie, IIIRutgers UniversityEmail verificata su rutgers.edu
- Liang WangBeijing Microelectronics Technology InstituteEmail verificata su vanderbilt.edu