Segui
Henning Friis Poulsen
Henning Friis Poulsen
Professor in physics, Technial University of Denmark
Email verificata su fysik.dtu.dk
Titolo
Citata da
Citata da
Anno
Three-dimensional X-ray diffraction microscopy: mapping polycrystals and their dynamics
HF Poulsen
Springer Science & Business Media, 2004
5632004
Grain nucleation and growth during phase transformations
SE Offerman, NH Van Dijk, J Sietsma, S Grigull, EM Lauridsen, ...
Science 298 (5595), 1003-1005, 2002
4432002
In situ measurement of grain rotation during deformation of polycrystals
L Margulies, G Winther, HF Poulsen
Science 291 (5512), 2392-2394, 2001
4232001
Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders
HF Poulsen, SF Nielsen, EM Lauridsen, S Schmidt, RM Suter, U Lienert, ...
Journal of applied crystallography 34 (6), 751-756, 2001
4062001
Amorphous silica studied by high energy X-ray diffraction
HF Poulsen, J Neuefeind, HB Neumann, JR Schneider, MD Zeidler
Journal of non-crystalline solids 188 (1-2), 63-74, 1995
3371995
X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case
W Ludwig, S Schmidt, EM Lauridsen, HF Poulsen
Journal of Applied Crystallography 41 (2), 302-309, 2008
3102008
Formation and subdivision of deformation structures during plastic deformation
B Jakobsen, HF Poulsen, U Lienert, J Almer, SD Shastri, HO Sørensen, ...
Science 312 (5775), 889-892, 2006
3082006
ESS technical design report
M Åberg, N Ahlfors, R Ainsworth, C Alba-Simionesco, S Alimov, ...
European Spallation Source, 2013
2422013
Dark-field X-ray microscopy for multiscale structural characterization
H Simons, A King, W Ludwig, C Detlefs, W Pantleon, S Schmidt, F Stöhr, ...
Nature communications 6 (1), 6098, 2015
2392015
Tracking: a method for structural characterization of grains in powders or polycrystals
EM Lauridsen, S Schmidt, RM Suter, HF Poulsen
Journal of applied crystallography 34 (6), 744-750, 2001
2352001
Measuring strain distributions in amorphous materials
HF Poulsen, JA Wert, J Neuefeind, V Honkimäki, M Daymond
Nature Materials 4 (1), 33-36, 2005
2312005
Relation between superconducting transition temperature and oxygen ordering in YBa2Cu306+x
H Friis Poulsen, N Hessel Andersen, JØ Vrtting Andersen, H Bohrt, ...
Nature 349 (6310), 594-596, 1991
2281991
Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction
J Oddershede, S Schmidt, HF Poulsen, HO Sørensen, J Wright, ...
Journal of Applied Crystallography 43 (3), 539-549, 2010
2272010
New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging
W Ludwig, A King, P Reischig, M Herbig, EM Lauridsen, S Schmidt, ...
Materials Science and Engineering: A 524 (1-2), 69-76, 2009
2062009
Lattice rotations of individual bulk grains: Part I: 3D X-ray characterization
HF Poulsen, L Margulies, S Schmidt, G Winther
Acta Materialia 51 (13), 3821-3830, 2003
1802003
Lattice rotations of individual bulk grains Part II: correlation with initial orientation and model comparison
G Winther, L Margulies, S Schmidt, HF Poulsen
Acta Materialia 52 (10), 2863-2872, 2004
1682004
An introduction to three-dimensional X-ray diffraction microscopy
HF Poulsen
Journal of Applied Crystallography 45 (6), 1084-1097, 2012
1662012
A triple-crystal diffractometer for high-energy synchrotron radiation at the HASYLAB high-field wiggler beamline BW5
R Bouchard, D Hupfeld, T Lippmann, J Neuefeind, HB Neumann, ...
Journal of Synchrotron Radiation 5 (2), 90-101, 1998
1651998
Applications of high-energy synchrotron radiation for structural studies of polycrystalline materials
HF Poulsen, S Garbe, T Lorentzen, D Juul Jensen, FW Poulsen, ...
Journal of synchrotron radiation 4 (3), 147-154, 1997
1501997
Three-dimensional orientation mapping in the transmission electron microscope
HH Liu, S Schmidt, HF Poulsen, A Godfrey, ZQ Liu, JA Sharon, X Huang
Science 332 (6031), 833-834, 2011
1402011
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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