| Ultrahigh energy heavy ion test beam on Xilinx Kintex-7 SRAM-based FPGA B Du, L Sterpone, S Azimi, DM Codinachs, V Ferlet-Cavrois, CB Polo, ... IEEE Transactions on Nuclear Science 66 (7), 1813-1819, 2019 | 45 | 2019 |
| On the reliability of convolutional neural network implementation on SRAM-based FPGA B Du, S Azimi, C De Sio, L Bozzoli, L Sterpone 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019 | 42 | 2019 |
| FireNN: Neural networks reliability evaluation on hybrid platforms C De Sio, S Azimi, L Sterpone IEEE Transactions on Emerging Topics in Computing 10 (2), 549-563, 2022 | 25 | 2022 |
| SEU evaluation of hardened-by-replication software in RISC-V soft processor C De Sio, S Azimi, A Portaluri, L Sterpone 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2021 | 24 | 2021 |
| Digital design techniques for dependable high performance computing S Azimi, L Sterpone 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 22 | 2020 |
| Analyzing radiation-induced transient errors on SRAM-based FPGAs by propagation of broadening effect C De Sio, S Azimi, L Sterpone, B Du IEEE Access 7, 140182-140189, 2019 | 22 | 2019 |
| A radiation-hardened CMOS full-adder based on layout selective transistor duplication S Azimi, C De Sio, L Sterpone IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (8 …, 2021 | 21 | 2021 |
| A 3-D simulation-based approach to analyze heavy ions-induced SET on digital circuits L Sterpone, F Luoni, S Azimi, B Du IEEE Transactions on Nuclear Science 67 (9), 2034-2041, 2020 | 20 | 2020 |
| On the analysis of radiation-induced failures in the AXI interconnect module C De Sio, S Azimi, L Sterpone Microelectronics Reliability 114, 113733, 2020 | 19 | 2020 |
| A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs S Azimi, B Du, L Sterpone, DM Codinachs, R Grimoldi, L Cattaneo Integration 67, 73-81, 2019 | 19 | 2019 |
| Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs C De Sio, S Azimi, L Bozzoli, B Du, L Sterpone Microelectronics Reliability 100, 113342, 2019 | 18 | 2019 |
| Analysis of single event effects on embedded processor S Azimi, C De Sio, D Rizzieri, L Sterpone Electronics 10 (24), 3160, 2021 | 17 | 2021 |
| An emulation platform for evaluating the reliability of deep neural networks C De Sio, S Azimi, L Sterpone 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 17 | 2020 |
| A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs L Sterpone, S Azimi, L Bozzoli, B Du, T Lange, M Glorieux, ... 2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 120-126, 2018 | 17 | 2018 |
| On the prediction of radiation-induced SETs in flash-based FPGAs S Azimi, B Du, L Sterpone Microelectronics Reliability 64, 230-234, 2016 | 17 | 2016 |
| On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs S Azimi, L Sterpone, B Du, L Boragno Microelectronics Reliability 88, 936-940, 2018 | 16 | 2018 |
| Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment S Azimi, B Du, L Sterpone Journal of Systems Architecture 75, 95-106, 2017 | 16 | 2017 |
| A selective mapper for the mitigation of SETs on rad-hard RTG4 flash-based FPGAs L Sterpone, S Azimi, B Du 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 16 | 2016 |
| A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS S Azimi, C De Sio, A Portaluri, D Rizzieri, L Sterpone Microelectronics Reliability 138, 114733, 2022 | 15 | 2022 |
| Radiation-induced single event transients modeling and testing on nanometric flash-based technologies L Sterpone, B Du, S Azimi Microelectronics Reliability 55 (9-10), 2087-2091, 2015 | 14 | 2015 |
Luca SterponePolitecnico di TorinoEmail verificata su polito.it
