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VM Dwyer
VM Dwyer
Reader in Electronic Devices, Loughborough University
Verified email at lboro.ac.uk - Homepage
Title
Cited by
Cited by
Year
Thermal failure in semiconductor devices
VM Dwyer, AJ Franklin, DS Campbell
Solid-state electronics 33 (5), 553-560, 1990
2521990
Background intensity determination in AES/XPS
VM Dwyer, JAD Matthew
Surface science 193 (3), 549-568, 1988
601988
The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solids
VM Dwyer, JAD Matthew
Surface science 143 (1), 57-83, 1984
591984
The depth distribution function in Auger/XPS analysis
VM Dwyer, JM Richards
Surface and interface analysis 18 (7), 555-560, 1992
541992
General approach to quantum mechanics as a statistical theory
RP Rundle, T Tilma, JH Samson, VM Dwyer, RF Bishop, MJ Everitt
Physical Review A 99 (1), 012115, 2019
442019
Electrostatic discharge thermal failure in semiconductor devices
VM Dwyer, AJ Franklin, DS Campbell
IEEE Transactions on Electron Devices 37 (11), 2381-2387, 1990
441990
A comparison of electron transport in AES/PES with neutron transport theory
VM Dwyer, JAD Matthew
Surface Science 152, 884-894, 1985
301985
The role of diffraction in dispersive optical bistability
D Weaire, JP Kermode, VM Dwyer
Optics communications 55 (3), 223-228, 1985
291985
Reconstruction of the depth profile from angle‐resolved AES/XPS
VM Dwyer
Surface and interface analysis 20 (8), 687-695, 1993
281993
Asum-over-paths' approach to diffusion on trees
PC Bressloff, VM Dwyer, MJ Kearney
Journal of Physics A: Mathematical and General 29 (9), 1881, 1996
251996
The effect of elastic scattering on the effective inelastic mean free path
VM Dwyer, JAD Matthew
Vacuum 33 (10-12), 767-769, 1983
231983
Algorithms and VLSI architectures for MPEG-4 motion estimation
S Agha, VM Dwyer
Electronic systems and control Division Research, 24-27, 2003
222003
An investigation of electromigration induced void nucleation time statistics in short copper interconnects
VM Dwyer
Journal of Applied Physics 107 (10), 2010
212010
Towards microbiological quality assurance in radiation sterilization processing: simulation of the radiation inactivation process
FR Fitch, PT Doolan, J Dwyer, VM Dwyer, NA Halls, A Tallentire
Journal of applied bacteriology 58 (3), 307-313, 1985
211985
Thermal breakdown in GaAs MES diodes
AJ Franklin, VM Dwyer, DS Campbell
Solid-State Electronics 33 (8), 1055-1064, 1990
201990
Electromigration failure in a finite conductor with a single blocking boundary
VM Dwyer, FS Wang, P Donaldson
Journal of applied physics 76 (11), 7305-7310, 1994
181994
Angular distribution of electrons elastically backscattered from surfaces
VM Dwyer
Surface and interface analysis 20 (6), 513-518, 1993
181993
Extraction of inelastic mean free path data from elastic electron backscattering data
VM Dwyer
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 12 (5 …, 1994
171994
The effect of short-range order on the vibrational entropy of one-dimensional chains
JAD Matthew, RE Jones, VM Dwyer
Journal of Physics F: Metal Physics 13 (3), 581, 1983
171983
Experimental and theoretical studies of EOS/ESD oxide breakdown in unprotected MOS structures
MJ Tunnicliffe, VM Dwyer, DS Campbell
Proc. EOS/ESD Symp 12, 162-168, 1990
161990
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