Michael J Mutch
Michael J Mutch
Micron Corporation
Email verificata su micron.com
Titolo
Citata da
Citata da
Anno
Spin transport, magnetoresistance, and electrically detected magnetic resonance in amorphous hydrogenated silicon nitride
MJ Mutch, PM Lenahan, SW King
Applied Physics Letters 109 (6), 062403, 2016
242016
Defect chemistry and electronic transport in low-κ dielectrics studied with electrically detected magnetic resonance
MJ Mutch, PM Lenahan, SW King
Journal of Applied Physics 119 (9), 094102, 2016
212016
Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability
MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ...
Microelectronics Reliability 63, 201-213, 2016
172016
Quantitative electrically detected magnetic resonance for device reliability studies
CJ Cochrane, M Anders, M Mutch, P Lenahan
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW), 6-9, 2014
32014
Radiation induced leakage currents in dense and porous low-k dielectrics
RJ Waskiewicz, MJ Mutch, PM Lenahan, SW King
2016 IEEE International Integrated Reliability Workshop (IIRW), 99-102, 2016
22016
Methods of forming crystallized materials from amorphous materials
AA Chavan, DVN Ramaswamy, M Mutch, S Chhajed
US Patent 10,790,145, 2020
2020
Devices comprising crystalline materials and related systems
M Mutch, M Nahar, WI Kinney
US Patent App. 16/898,029, 2020
2020
Methods of forming semiconductor structures
M Mutch, M Nahar, WI Kinney
US Patent 10,707,298, 2020
2020
Methods of forming semiconductor structures
M Mutch, M Nahar
US Patent App. 16/121,928, 2020
2020
Methods of Forming Crystalline Semiconductor Material, and Methods of Forming Transistors
M Nahar, DF Fan, J Liu-Norrod, M Mutch
US Patent App. 16/112,410, 2020
2020
Defects in N-Rich, Si-Rich, and Stoichiometric Silicon Nitride Thin Films Observed Using Electrically Detected Magnetic Resonance and Near-Zero Field Magnetoresistance
R Waskiewicz, M Mutch, P Lenahan, S King
APS 2018, K11. 013, 2018
2018
Electrically Detected Study of Variable Range Hopping in Silicon Nitrides
R Waskiewicz, M Mutch, P Lenahan, S King
APS 2017, E42. 004, 2017
2017
Magnetic Resonance and Magnetoresistance for the Understanding of Defect Chemistry and Spin-Transport in Amorphous Semiconductors and Dielectrics
MJ Mutch
2016
Band diagram for low-k/Cu interconnects
MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ...
Microelectronics Reliability, 2016
2016
КОНФЕРЕНЦИЯ
SE Tyaginov, A Makarov, M Jech, P Sharma, T Grasser, J Franco, ...
2016
Magnetoresistance Phenomena in a Variety of Amorphous Semiconductors and Insulators
M Mutch, D Westley, P Lenahan
APS 2016, H7. 006, 2016
2016
PLATFORM TECHNICAL PRESENTATIONS Session
U Celano, W Vandervorst, C Cochrane, M Anders, M Mutch, P Lenahan, ...
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
Articoli 1–17