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Wentao Qin
Wentao Qin
On Semiconductor
Email verificata su onsemi.com
Titolo
Citata da
Citata da
Anno
Promotion of water-mediated carbon removal by nanostructured barium oxide/nickel interfaces in solid oxide fuel cells
L Yang, YM Choi, W Qin, H Chen, K Blinn, M Liu, P Liu, J Bai, TA Tyson, ...
Nature communications 2 (1), 357, 2011
3622011
Anomalous pseudocapacitive behavior of a nanostructured, mixed-valent manganese oxide film for electrical energy storage
MK Song, S Cheng, H Chen, W Qin, KW Nam, S Xu, XQ Yang, ...
Nano letters 12 (7), 3483-3490, 2012
2892012
Enhancement of La 0.6 Sr 0.4 Co 0.2 Fe 0.8 O 3-δ durability and surface electrocatalytic activity by La 0.85 Sr 0.15 MnO 3±δ investigated using a new test electrode platform
ME Lynch, L Yang, W Qin, JJ Choi, M Liu, K Blinn, M Liu
Energy & Environmental Science 4 (6), 2249-2258, 2011
2132011
Direct octane fuel cells: A promising power for transportation
M Liu, YM Choi, L Yang, K Blinn, W Qin, P Liu, M Liu
Nano Energy 1 (3), 448-455, 2012
1482012
Making sense of nanocrystal lattice fringes
P Fraundorf, W Qin, P Moeck, E Mandell
Journal of Applied Physics 98 (11), 2005
502005
Lattice parameters from direct-space images at two tilts
W Qin, P Fraundorf
Ultramicroscopy 94 (3-4), 245-262, 2003
342003
Electrical and electrocatalytic properties of a La0. 8Sr0. 2Co0. 17Mn0. 83O3− δ cathode for intermediate-temperature solid oxide fuel cells
Y Bai, M Liu, D Ding, K Blinn, W Qin, J Liu, M Liu
Journal of Power Sources 205, 80-85, 2012
332012
FIB failure analysis of memory arrays
AA Volinsky, L Rice, W Qin, ND Theodore
Microelectronic Engineering 75 (1), 3-11, 2004
292004
Corrosion mechanisms of Cu wire bonding on Al pads
W Qin, H Anderson, T Anderson, G Chang, D Barrientos
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), 1446-1454, 2018
192018
Surface oxide evolution on Al–Si bond wires for high-power RF applications
W Qin, R Doyle, T Scharr, M Shah, M Kottke, G Chen, D Theodore
Microelectronic engineering 75 (1), 111-116, 2004
162004
Mechanism to improve the reliability of copper wire bonding with palladium-coating of the wire
W Qin, T Anderson, G Chang
Microelectronics Reliability 99, 239-244, 2019
92019
Direct space(nano) crystallography via high-resolution transmission electron microscopy
W Qin
University of Missouri, St. Louis, 2000
82000
Image-based nanocrystallography by means of transmission electron goniometry
P Moeck, W Qin, P Fraundorf
Nonlinear Analysis: Theory, Methods & Applications 63 (5-7), e1323-e1331, 2005
72005
Spontaneous oxide reduction in metal stacks
W Qin, AA Volinsky, D Werho, ND Theodore, M Kottke, C Ramiah
Thin Solid Films 473 (2), 236-240, 2005
62005
Wire bonding systems and related methods
QIN Wentao, GM Grivna, H Anderson, T Anderson, G Chang
US Patent 10,109,610, 2018
52018
Towards 3D image-based nanocrystallography by means of transmission electron goniometry
P Moeck, W Qin, PB Fraundorf
MRS Online Proceedings Library (OPL) 839, P4. 3, 2004
52004
Copper Wire Bond Optimization for Power Devices
T Pinili, R Manolo, A Denoyo, B Yabut, D Moore, B Cowell, J Jenson, ...
2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018
42018
Stress-induced anisotropy of graphitelike amorphous carbon
S Zollner, W Qin, RB Gregory, NV Edwards, K Junker, TE Tiwald
Journal of Applied Physics 101 (5), 2007
42007
Image-based nanocrystallography in future aberration-corrected transmission electron microscopes
P Moeck, W Qin, PB Fraundorf
MRS Online Proceedings Library (OPL) 818, M11. 3.1, 2004
42004
Foreword: Special Section on “The Reliability of Advanced Microelectronic Packaging—Part I: Management of Thermal Effects”
Y Li, W Qin
IEEE Transactions on Components, Packaging and Manufacturing Technology 10 …, 2020
32020
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Articoli 1–20