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Marion GilsonProfessor, Université de LorraineEmail verificata su cran.uhp-nancy.fr
Fengwei ChenWuhan UniversityEmail verificata su whu.edu.cn
Thierry BastogneCRAN UL-CNRS | INRIA BIGSEmail verificata su univ-lorraine.fr
Roland TothAssociate Professor, Eindhoven University of TechnologyEmail verificata su tue.nl
Liuping WangProfessor of Control Engineering, RMIT UniversityEmail verificata su rmit.edu.au
Paul M.J. Van den HofProfessor Eindhoven University of TechnologyEmail verificata su tue.nl
Stéphane VictorIMS, Université de BordeauxEmail verificata su ims-bordeaux.fr
Rachid MaltiUniversité de BordeauxEmail verificata su ims-bordeaux.fr
NI BoyiSAP LabsEmail verificata su sap.com
Alexandre JanotONERA PalaiseauEmail verificata su onera.fr
Arturo Padilla BernedoUniversidad de La Frontera, Department of Mechanical EngineeringEmail verificata su ufrontera.cl
Kaushik MahataAssociate Professor of Electrical Engineering, University of Newcastle, AustraliaEmail verificata su newcastle.edu.au
Juan C. AgüeroUniversidad Tecnica Federico Santa Maria (Chile)Email verificata su usm.cl
Juan I. YuzUniversidad Tecnica Federico Santa MariaEmail verificata su usm.cl
Xiangtao ZhuanWuhan UinversityEmail verificata su whu.edu.cn
Chunting Chris MiDistinguished Professor, Electrical and Computer Engineering, San Diego State UniversityEmail verificata su ieee.org
Bing XiaPh.D.Email verificata su ucsd.edu
Truong NguyenUCSDEmail verificata su eng.ucsd.edu
James WelshUniversity of NewcastleEmail verificata su newcastle.edu.au
Liu TaoProfessor, Dalian University of Technology, ChinaEmail verificata su dlut.edu.cn