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- Makoto NagataProfessor, Kobe UniversityEmail verificata su cs.kobe-u.ac.jp
- Takayasu SakuraiUniversity of TokyoEmail verificata su iis.u-tokyo.ac.jp
- Daisuke FujimotoNara Institute of Science and TechnologyEmail verificata su is.naist.jp
- Yu-ichi HAYASHINara Institute of Science and TechnologyEmail verificata su is.naist.jp
- Takuji MikiKobe UniversityEmail verificata su port.kobe-u.ac.jp
- Kazuo SakiyamaThe University of Electro-CommunicationsEmail verificata su uec.ac.jp
- Naofumi HommaTohoku UniversityEmail verificata su riec.tohoku.ac.jp
- Kohei MatsudaKobe UniversityEmail verificata su cs26.scitec.kobe-u.ac.jp
- Kiichi NiitsuKyoto UniversityEmail verificata su i.kyoto-u.ac.jp
- Jean-Luc DangerLTCI, Télécom Paris, Institut Polytechnique de ParisEmail verificata su enst.fr
- Shivam BhasinNTU SingaporeEmail verificata su ntu.edu.sg
- Hideharu AmanoKeio UniversityEmail verificata su am.ics.keio.ac.jp
- Hiroki MatsutaniDept of ICS, Keio UniversityEmail verificata su arc.ics.keio.ac.jp
- Yusmeeraz YusofUniversiti Teknologi MalaysiaEmail verificata su utm.my
- Takeshi SugawaraThe University of Electro-CommunicationsEmail verificata su uec.ac.jp
- Hayun ChungAssistant Professor of Electronics and Information Engineering, Korea UniversityEmail verificata su korea.ac.kr
- Jakub BreierSenior Cybersecurity Manager, TTControl GmbH, Vienna, AustriaEmail verificata su ttcontrol.com
- Zakaria NajmResearch Associate,NTU SingaporeEmail verificata su ntu.edu.sg
- Lan NanQualcomm Technologies Inc./ University of California, Los AngelesEmail verificata su ee.ucla.edu
- Won-Joo (Ryan) YunCorporate VP, Samsung ElectronicsEmail verificata su samsung.com