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- Sergey NikishinProfessor of Electrical Engineering, Texas Tech UniversityEmail verificata su ttu.edu
- Jordan BergUS National Science FoundationEmail verificata su nsf.gov
- Ayrton BernussiProfessor of Electrical and Computer EngineeringEmail verificata su ttu.edu
- Zhaoyang FanProfessor of Electrical Engineering, Arizona State UniversityEmail verificata su asu.edu
- M.NazariVisiting Scholar, Texas State UniversityEmail verificata su txstate.edu
- Edwin PinerProfessor, Texas State UniversityEmail verificata su txstate.edu
- Sandeep Sohal, PhDSenior Reliability Engineer, Infinera CorporationEmail verificata su infinera.com
- Yong Zhao, Ph.D.View, Inc.Email verificata su viewglass.com
- yanhan zhuIntel Corp.Email verificata su intel.com
- D. H. S. MaithripalaUniversity of Peradeniya, Sri LankaEmail verificata su eng.pdn.ac.lk
- shubhra gangopadhyayProfessor of Electrical EngineeringEmail verificata su missouri.edu
- Stefan ZollnerNew Mexico State UniversityEmail verificata su nmsu.edu
- Iulian GherasoiuSUNY Polytechnic InstituteEmail verificata su sunyit.edu
- Gulten KARAOGLAN-BEBEKIntelEmail verificata su intel.com
- R ZallenProfessor of Physics, Virginia TechEmail verificata su vt.edu
- Luis Grave de PeraltaProfessor of Physics, Texas Tech UniversityEmail verificata su ttu.edu
- Xuan PanPhD of Electrical Engineering, Nano Tech Center, Texas Tech UniversityEmail verificata su ttu.edu
- Raju Ahmed, Ph. D.Sr R&D Engineer at Micron TechnologyEmail verificata su micron.com
- Dan FeketeProfessor of Physics, Physics Dept., TechnionEmail verificata su tx.technion.ac.il
- Anwar SiddiqueProduct Engineer, Intel CorpEmail verificata su intel.com