| Quantitative mechanical property mapping at the nanoscale with PeakForce QNM B Pittenger, N Erina, C Su Application Note Veeco Instruments Inc 1, 2010 | 282 | 2010 |
| Premelting at ice-solid interfaces studied via velocity-dependent indentation with force microscope tips B Pittenger, SC Fain Jr, MJ Cochran, JMK Donev, BE Robertson, ... Physical Review B 63 (13), 134102, 2001 | 78 | 2001 |
| Investigation of ice-solid interfaces by force microscopy: plastic flow and adhesive forces B Pittenger, DJ Cook, CR Slaughterbeck, SC Fain Jr Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (3 …, 1998 | 40 | 1998 |
| Mechanical property mapping at the nanoscale using PeakForce QNM scanning probe technique B Pittenger, N Erina, C Su Nanomechanical analysis of high performance materials, 31-51, 2014 | 38 | 2014 |
| Measuring average tip-sample forces in intermittent-contact (tapping) force microscopy in air SC Fain Jr, KA Barry, MG Bush, B Pittenger, RN Louie Applied Physics Letters 76 (7), 930-932, 2000 | 32 | 2000 |
| Nanoscale mechanics by tomographic contact resonance atomic force microscopy G Stan, SD Solares, B Pittenger, N Erina, C Su Nanoscale 6 (2), 962-969, 2014 | 31 | 2014 |
| Single molecule transcription profiling with AFM J Reed, B Mishra, B Pittenger, S Magonov, J Troke, MA Teitell, ... Nanotechnology 18 (4), 044032, 2006 | 27 | 2006 |
| Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment CR Slaughterbeck, EW Kukes, B Pittenger, DJ Cook, PC Williams, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (3 …, 1996 | 27 | 1996 |
| Simultaneous electrical and mechanical property mapping at the nanoscale with PeakForce TUNA C Li, S Minne, B Pittenger, A Mednick, M Guide, TQ Nguyen Bruker application note AN132 Rev. A, 2011 | 20 | 2011 |
| Preamplifying cantilevers for dynamic atomic force microscopy B Zeyen, K Virwani, B Pittenger, KL Turner Applied Physics Letters 94 (10), 103507, 2009 | 19 | 2009 |
| Performing quantitative nanomechanical AFM measurements on live cells B Pittenger, A Slade Microscopy today 21 (6), 12-17, 2013 | 12 | 2013 |
| Nanoscale quantitative mechanical property mapping using peak force tapping atomic force microscopy SC Minne, Y Hu, S Hu, B Pittenger, C Su Microscopy and Microanalysis 16 (S2), 464-465, 2010 | 11 | 2010 |
| Nanomechanical analysis of high performance materials Solid Mechanics and Its Applications ed A Tiwari B Pittenger, N Erina, C Su Berlin: Springer) p, 2013 | 10 | 2013 |
| Preamplifying cantilever and applications thereof B Pittenger, K Virwani, B Zeyen US Patent 7,979,916, 2011 | 9 | 2011 |
| Toward quantitative nanomechanical measurements on live cells with PeakForce QNM B Pittenger, A Slade, A Berquand, P Milani, A Boudaoud, O Hamant Bruker Application Note# 141, 2013 | 8 | 2013 |
| Method and apparatus of tuning a scanning probe microscope C Su, P Silva, L Huang, B Pittenger, S Hu US Patent 8,997,259, 2015 | 7 | 2015 |
| Quantitative mechanical property mapping at the nanoscale with PeakForce QNM Bruker Application Note AN128 B Pittenger, N Erina, C Su Bruker Nano Surfaces Division, 2010 | 5 | 2010 |
| Atomic force microscopy with Raman and tip-enhanced Raman spectroscopy SB Kaemmer, T Ruiter, B Pittenger Microscopy Today 20 (6), 22-27, 2012 | 4 | 2012 |
| Nanoscale DMA with the Atomic Force Microscope: A New Method for Measuring Viscoelastic Properties of Nanostructured Polymer Materials B Pittenger, S Osechinskiy, D Yablon, T Mueller JOM 71 (10), 3390-3398, 2019 | 3 | 2019 |
| Functional Imaging with Higher-Dimensional Electrical Data Sets P De Wolf, Z Huang, B Pittenger, A Dujardin, M Febvre, D Mariolle, ... Microscopy Today 26 (6), 18-27, 2018 | 2 | 2018 |
Andrea SladeBruker Nano Inc.Email verificata su bruker-nano.com
