Bede Pittenger
Bede Pittenger
Bruker
Email verificata su bruker.com
Titolo
Citata da
Citata da
Anno
Quantitative mechanical property mapping at the nanoscale with PeakForce QNM
B Pittenger, N Erina, C Su
Application Note Veeco Instruments Inc 1, 2010
2822010
Premelting at ice-solid interfaces studied via velocity-dependent indentation with force microscope tips
B Pittenger, SC Fain Jr, MJ Cochran, JMK Donev, BE Robertson, ...
Physical Review B 63 (13), 134102, 2001
782001
Investigation of ice-solid interfaces by force microscopy: plastic flow and adhesive forces
B Pittenger, DJ Cook, CR Slaughterbeck, SC Fain Jr
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (3…, 1998
401998
Mechanical property mapping at the nanoscale using PeakForce QNM scanning probe technique
B Pittenger, N Erina, C Su
Nanomechanical analysis of high performance materials, 31-51, 2014
382014
Measuring average tip-sample forces in intermittent-contact (tapping) force microscopy in air
SC Fain Jr, KA Barry, MG Bush, B Pittenger, RN Louie
Applied Physics Letters 76 (7), 930-932, 2000
322000
Nanoscale mechanics by tomographic contact resonance atomic force microscopy
G Stan, SD Solares, B Pittenger, N Erina, C Su
Nanoscale 6 (2), 962-969, 2014
312014
Single molecule transcription profiling with AFM
J Reed, B Mishra, B Pittenger, S Magonov, J Troke, MA Teitell, ...
Nanotechnology 18 (4), 044032, 2006
272006
Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment
CR Slaughterbeck, EW Kukes, B Pittenger, DJ Cook, PC Williams, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (3…, 1996
271996
Simultaneous electrical and mechanical property mapping at the nanoscale with PeakForce TUNA
C Li, S Minne, B Pittenger, A Mednick, M Guide, TQ Nguyen
Bruker application note AN132 Rev. A, 2011
202011
Preamplifying cantilevers for dynamic atomic force microscopy
B Zeyen, K Virwani, B Pittenger, KL Turner
Applied Physics Letters 94 (10), 103507, 2009
192009
Performing quantitative nanomechanical AFM measurements on live cells
B Pittenger, A Slade
Microscopy today 21 (6), 12-17, 2013
122013
Nanoscale quantitative mechanical property mapping using peak force tapping atomic force microscopy
SC Minne, Y Hu, S Hu, B Pittenger, C Su
Microscopy and Microanalysis 16 (S2), 464-465, 2010
112010
Nanomechanical analysis of high performance materials Solid Mechanics and Its Applications ed A Tiwari
B Pittenger, N Erina, C Su
Berlin: Springer) p, 2013
102013
Preamplifying cantilever and applications thereof
B Pittenger, K Virwani, B Zeyen
US Patent 7,979,916, 2011
92011
Toward quantitative nanomechanical measurements on live cells with PeakForce QNM
B Pittenger, A Slade, A Berquand, P Milani, A Boudaoud, O Hamant
Bruker Application Note# 141, 2013
82013
Method and apparatus of tuning a scanning probe microscope
C Su, P Silva, L Huang, B Pittenger, S Hu
US Patent 8,997,259, 2015
72015
Quantitative mechanical property mapping at the nanoscale with PeakForce QNM Bruker Application Note AN128
B Pittenger, N Erina, C Su
Bruker Nano Surfaces Division, 2010
52010
Atomic force microscopy with Raman and tip-enhanced Raman spectroscopy
SB Kaemmer, T Ruiter, B Pittenger
Microscopy Today 20 (6), 22-27, 2012
42012
Nanoscale DMA with the Atomic Force Microscope: A New Method for Measuring Viscoelastic Properties of Nanostructured Polymer Materials
B Pittenger, S Osechinskiy, D Yablon, T Mueller
JOM 71 (10), 3390-3398, 2019
32019
Functional Imaging with Higher-Dimensional Electrical Data Sets
P De Wolf, Z Huang, B Pittenger, A Dujardin, M Febvre, D Mariolle, ...
Microscopy Today 26 (6), 18-27, 2018
22018
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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