Michele Risi
TitoloCitata daAnno
Design pattern recovery through visual language parsing and source code analysis
A De Lucia, V Deufemia, C Gravino, M Risi
Journal of Systems and Software 82 (7), 1177-1193, 2009
902009
Design pattern recovery by visual language parsing
G Costagliola, A De Lucia, V Deufemia, C Gravino, M Risi
Ninth European Conference on Software Maintenance and Reengineering, 102-111, 2005
602005
Sketch grammars: A formalism for describing and recognizing diagrammatic sketch languages
G Costagliola, V Deufemia, M Risi
Eighth International Conference on Document Analysis and Recognition (ICDAR …, 2005
462005
Improving behavioral design pattern detection through model checking
A De Lucia, V Deufemia, C Gravino, M Risi
2010 14th European Conference on Software Maintenance and Reengineering, 176-185, 2010
452010
Behavioral pattern identification through visual language parsing and code instrumentation
A De Lucia, V Deufemia, C Gravino, M Risi
2009 13th European Conference on Software Maintenance and Reengineering, 99-108, 2009
422009
A parsing technique for sketch recognition systems
G Costagliola, V Deufemia, G Polese, M Risi
2004 IEEE Symposium on Visual Languages-Human Centric Computing, 19-26, 2004
342004
Using Project-Based-Learning in a mobile application development course—An experience report
R Francese, C Gravino, M Risi, G Scanniello, G Tortora
Journal of Visual Languages & Computing 31, 196-205, 2015
312015
MicroApps development on mobile phones
S Cuccurullo, R Francese, M Risi, G Tortora
International Symposium on End User Development, 289-294, 2011
282011
MicroApps development on mobile phones
S Cuccurullo, R Francese, M Risi, G Tortora
International Symposium on End User Development, 289-294, 2011
282011
Architecture recovery using latent semantic indexing and k-means: an empirical evaluation
M Risi, G Scanniello, G Tortora
2010 8th IEEE International Conference on Software Engineering and Formal …, 2010
272010
Sketched symbol recognition using latent-dynamic conditional random fields and distance-based clustering
V Deufemia, M Risi, G Tortora
Pattern Recognition 47 (3), 1159-1171, 2014
252014
A two phase approach to design pattern recovery
A De Lucia, V Deufemia, C Gravino, M Risi
11th European Conference on Software Maintenance and Reengineering (CSMR'07 …, 2007
252007
An Eclipse plug-in for the detection of design pattern instances through static and dynamic analysis
A De Lucia, V Deufemia, C Gravino, M Risi
2010 IEEE International Conference on Software Maintenance, 1-6, 2010
242010
A multi-layer parsing strategy for on-line recognition of hand-drawn diagrams
G Costagliola, V Vincenzo, M Risi
Visual Languages and Human-Centric Computing (VL/HCC'06), 103-110, 2006
242006
Case studies of visual language based design patterns recovery
G Costagliola, A De Lucia, V Deufemia, C Gravino, M Risi
Conference on Software Maintenance and Reengineering (CSMR'06), 10 pp.-174, 2006
222006
Documenting design-pattern instances: A family of experiments on source-code comprehensibility
G Scanniello, C Gravino, M Risi, G Tortora, G Dodero
ACM Transactions on Software Engineering and Methodology (TOSEM) 24 (3), 14, 2015
212015
Clustering algorithms and latent semantic indexing to identify similar pages in web applications
A De Lucia, M Risi, G Tortora, G Scanniello
2007 9th IEEE International Workshop on Web Site Evolution, 65-72, 2007
212007
Using fold-in and fold-out in the architecture recovery of software systems
M Risi, G Scanniello, G Tortora
Formal Aspects of Computing 24 (3), 307-330, 2012
202012
On the use of requirements measures to predict software project and product measures in the context of android mobile apps: a preliminary study
R Francese, C Gravino, M Risi, G Scanniello, G Tortora
2015 41st Euromicro Conference on Software Engineering and Advanced …, 2015
192015
MetricAttitude: a visualization tool for the reverse engineering of object oriented software
M Risi, G Scanniello
Proceedings of the International Working Conference on Advanced Visual …, 2012
192012
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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