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Kelson Chabak
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3.8 MV/cm Breakdown Strength of MOVPE-Grown Sn-doped β-Ga2O3 MOSFETs
AJ Green, KD Chabak, ER Heller, RC Fitch, M Baldini, A Fiedler, ...
IEEE Electron Device Letters 37 (7), 902-905, 2016
5812016
Enhancement-mode Ga2O3 wrap-gate fin field-effect transistors on native (100) β-Ga2O3 substrate with high breakdown voltage (Cover Image)
KD Chabak, N Moser, AJ Green, DE Walker Jr, SE Tetlak, E Heller, ...
Applied Physics Letters 109 (21), 213501, 2016
3702016
Demonstration of high mobility and quantum transport in modulation-doped β-(AlxGa1-x) 2O3/Ga2O3 heterostructures
Y Zhang, A Neal, Z Xia, C Joishi, JM Johnson, Y Zheng, S Bajaj, ...
Applied Physics Letters 112 (17), 2018
3492018
β-Ga2O3 MOSFETs for Radio Frequency Operation
AJ Green, KD Chabak, M Baldini, N Moser, R Gilbert, RC Fitch, G Wagner, ...
IEEE Electron Device Letters 38 (6), 790-793, 2017
2992017
Donors and deep acceptors in β-Ga2O3
AT Neal, S Mou, S Rafique, H Zhao, E Ahmadi, JS Speck, KT Stevens, ...
Applied Physics Letters 113 (6), 2018
2522018
Recessed-Gate Enhancement-mode β-Ga2O3 MOSFETs
KD Chabak, JP McCandless, NA Moser, AJ Green, K Mahalingam, ...
IEEE Electron Device Letters, 2018
2192018
β-Gallium oxide power electronics
AJ Green, J Speck, G Xing, P Moens, F Allerstam, K Gumaelius, T Neyer, ...
Apl Materials 10 (2), 2022
2152022
Ge-Doped β-Ga2O3 MOSFETs
N Moser, J McCandless, A Crespo, K Leedy, A Green, A Neal, S Mou, ...
IEEE Electron Device Letters 38 (6), 775-778, 2017
1932017
Highly conductive homoepitaxial Si-doped Ga2O3 films on (010) β-Ga2O3 by pulsed laser deposition
KD Leedy, KD Chabak, V Vasilyev, DC Look, JJ Boeckl, JL Brown, ...
Applied Physics Letters 111 (1), 2017
1772017
High-power Ka-band performance of AlInN/GaN HEMT with 9.8-nm-thin barrier
A Crespo, MM Bellot, KD Chabak, JK Gillespie, GH Jessen, V Miller, ...
IEEE Electron Device Letters 31 (1), 2-4, 2010
1212010
Incomplete Ionization of a 110 meV Unintentional Donor in β-Ga2O3 and its Effect on Power Devices
AT Neal, S Mou, R Lopez, JV Li, DB Thomson, KD Chabak, GH Jessen
Scientific reports 7 (1), 13218, 2017
1182017
Flexible gallium nitride for high‐performance, strainable radio‐frequency devices
NR Glavin, KD Chabak, ER Heller, EA Moore, TA Prusnick, B Maruyama, ...
Advanced Materials 29 (47), 1701838, 2017
1162017
Lateral β-Ga2O3 field effect transistors
KD Chabak, KD Leedy, AJ Green, S Mou, AT Neal, T Asel, ER Heller, ...
Semiconductor Science and Technology 35 (1), 013002, 2019
1142019
Full-wafer characterization of AlGaN/GaN HEMTs on free-standing CVD diamond substrates
KD Chabak, JK Gillespie, V Miller, A Crespo, J Roussos, M Trejo, ...
IEEE Electron Device Letters 31 (2), 99-101, 2010
962010
High pulsed current density β-Ga2O3 MOSFETs verified by an analytical model corrected for interface charge
NA Moser, JP McCandless, A Crespo, KD Leedy, AJ Green, ER Heller, ...
Applied Physics Letters 110 (14), 143505, 2017
902017
III-V Junctionless Gate-All-Around Nanowire MOSFETs for High Linearity Low Power Applications
Y Song, C Zhang, R Dowdy, K Chabak, PK Mohseni, W Choi, X Li
IEEE Electron Device Letters 35 (3), 324-326, 2014
832014
ScAlN/GaN high-electron-mobility transistors with 2.4-A/mm current density and 0.67-S/mm transconductance
AJ Green, JK Gillespie, RC Fitch, DE Walker, M Lindquist, A Crespo, ...
IEEE Electron Device Letters 40 (7), 1056-1059, 2019
752019
Thermal properties of AlGaN/GaN HFETs on bulk GaN substrates
N Killat, M Montes, JW Pomeroy, T Paskova, KR Evans, J Leach, X Li, ...
IEEE Electron device letters 33 (3), 366-368, 2012
752012
Implementation of High Power Density X-Band AlGaN/GaN High Electron Mobility Transistors (HEMTs) in a Millimeter-Wave Monolithic Microwave Integrated Circuit (MMIC) Process
R Fitch, D Walker, A Green, S Tetlak, J Gillespie, R Gilbert, K Sutherlin, ...
IEEE Electron Device Letters 36 (10), 1004-1007, 2015
682015
High Aspect Ratio β-Ga2O3 Fin Arrays with Low-Interface Charge Density by Inverse Metal-Assisted Chemical Etching
HC Huang, M Kim, X Zhan, K Chabak, JD Kim, A Kvit, D Liu, Z Ma, JM Zuo, ...
ACS nano 13 (8), 8784-8792, 2019
672019
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