| Ultrawide‐bandgap semiconductors: research opportunities and challenges JY Tsao, S Chowdhury, MA Hollis, D Jena, NM Johnson, KA Jones, ... Advanced Electronic Materials 4 (1), 1600501, 2018 | 1145 | 2018 |
| Universal phonon mean free path spectra in crystalline semiconductors at high temperature JP Freedman, JH Leach, EA Preble, Z Sitar, RF Davis, JA Malen Scientific reports 3 (1), 2963, 2013 | 177 | 2013 |
| High electron mobility in nearly lattice-matched AlInN∕ AlN∕ GaN heterostructure field effect transistors J Xie, X Ni, M Wu, JH Leach, Ü Özgür, H Morkoç Applied Physics Letters 91 (13), 2007 | 162 | 2007 |
| Thermal conductivity of GaN, , and SiC from 150 K to 850 K Q Zheng, C Li, A Rai, JH Leach, DA Broido, DG Cahill Physical Review Materials 3 (1), 014601, 2019 | 139 | 2019 |
| High-k Oxide Field-Plated Vertical (001) β-Ga2O3 Schottky Barrier Diode With Baliga’s Figure of Merit Over 1 GW/cm2 S Roy, A Bhattacharyya, P Ranga, H Splawn, J Leach, S Krishnamoorthy IEEE Electron Device Letters 42 (8), 1140-1143, 2021 | 117 | 2021 |
| Halide vapor phase epitaxial growth of β-Ga2O3 and α-Ga2O3 films JH Leach, K Udwary, J Rumsey, G Dodson, H Splawn, KR Evans APL Materials 7 (2), 2019 | 108 | 2019 |
| The effect of AlN interlayer thicknesses on scattering processes in lattice-matched AlInN/GaN two-dimensional electron gas heterostructures A Teke, S Gökden, R Tülek, JH Leach, Q Fan, J Xie, Ü Özgür, H Morkoç, ... New Journal of Physics 11 (6), 063031, 2009 | 89 | 2009 |
| Small signal equivalent circuit modeling for AlGaN/GaN HFET: Hybrid extraction method for determining circuit elements of AlGaN/GaN HFET Q Fan, JH Leach, H Morkoc Proceedings of the IEEE 98 (7), 1140-1150, 2010 | 83 | 2010 |
| Thermal properties of AlGaN/GaN HFETs on bulk GaN substrates N Killat, M Montes, JW Pomeroy, T Paskova, KR Evans, J Leach, X Li, ... IEEE Electron device letters 33 (3), 366-368, 2012 | 75 | 2012 |
| Evaluation of the concentration of point defects in GaN MA Reshchikov, A Usikov, H Helava, Y Makarov, V Prozheeva, ... Scientific Reports 7 (1), 9297, 2017 | 69 | 2017 |
| Hot-electron energy relaxation time in AlInN/AlN/GaN 2DEG channels A Matulionis, J Liberis, E Šermukšnis, J Xie, JH Leach, M Wu, H Morkoç Semiconductor science and technology 23 (7), 075048, 2008 | 60 | 2008 |
| Degradation in InAlN/GaN-based heterostructure field effect transistors: Role of hot phonons JH Leach, CY Zhu, M Wu, X Ni, X Li, J Xie, Ü Özgür, H Morkoç, J Liberis, ... Applied Physics Letters 95 (22), 2009 | 57 | 2009 |
| Electron mobility in InGaN channel heterostructure field effect transistor structures with different barriers J Xie, JH Leach, X Ni, M Wu, R Shimada, Ü Özgür, H Morkoç Applied Physics Letters 91 (26), 2007 | 57 | 2007 |
| On the accurate determination of absorption coefficient from reflectanceand transmittance measurements: application to Fe-doped GaN DC Look, JH Leach Journal of Vacuum Science & Technology B 34 (4), 2016 | 55 | 2016 |
| Ga2O3-on-SiC Composite Wafer for Thermal Management of Ultrawide Bandgap Electronics Y Song, D Shoemaker, JH Leach, C McGray, HL Huang, A Bhattacharyya, ... ACS Applied Materials & Interfaces 13 (34), 40817-40829, 2021 | 54 | 2021 |
| Status of reliability of GaN-based heterojunction field effect transistors JH Leach, H Morkoc Proceedings of the IEEE 98 (7), 1127-1139, 2010 | 52 | 2010 |
| Electron drift velocity in lattice-matched AlInN/AlN/GaN channel at high electric fields L Ardaravičius, M Ramonas, J Liberis, O Kiprijanovič, A Matulionis, J Xie, ... Journal of Applied Physics 106 (7), 2009 | 50 | 2009 |
| The impact of film thickness and substrate surface roughness on the thermal resistance of aluminum nitride nucleation layers Z Su, JP Freedman, JH Leach, EA Preble, RF Davis, JA Malen Journal of Applied Physics 113 (21), 2013 | 49 | 2013 |
| Effect of Si doping on the thermal conductivity of bulk GaN at elevated temperatures–theory and experiment PP Paskov, M Slomski, JH Leach, JF Muth, T Paskova AIP advances 7 (9), 2017 | 48 | 2017 |
| The effect of hydrogen etching on 6H-SiC studied by temperature-dependent current-voltage and atomic force microscopy S Doğan, D Johnstone, F Yun, S Sabuktagin, J Leach, AA Baski, ... Applied physics letters 85 (9), 1547-1549, 2004 | 48 | 2004 |
