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- Minghao QiPurdue UniversityEmail verificata su purdue.edu
- Andrew M. WeinerProfessor of Electrical and Computer Engineering, Purdue UniversityEmail verificata su purdue.edu
- Yi XUANUniversity of Pittsburgh, School of MedicineEmail verificata su pitt.edu
- Sangsik KimAssociate Professor of Electrical Engineering, Korea Advanced Institute of Science and TechnologyEmail verificata su kaist.ac.kr
- Jose Jaramillo-VillegasPurdue University, Universidad Tecnológica de PereiraEmail verificata su utp.edu.co
- Min TengimecEmail verificata su imec-int.com
- Abdullah Al NomanFailure Analysis R&D Engineer at Intel CorporationEmail verificata su intel.com
- Victor YurlovPrincipal Engineer of Samsung Electromechanics (Optics, MEMS, ISP)Email verificata su samsung.com
- Vladimir A. AksyukProject Leader, Physical Measurement Laboratory, NISTEmail verificata su nist.gov
- Thomas LeBrunGroup Leader for Photonics and Optomechanics, NISTEmail verificata su nist.gov
- Junyeob SongNational Institute of Standards and Technology & University of DelawareEmail verificata su NIST.GOV
- David LongNational Institute of Standards and TechnologyEmail verificata su nist.gov
- Nan Ei Yu (N. E. Yu)Gwngju Institute of Science and Technology (GIST)Email verificata su gist.ac.kr