Effect of sliding speed on wear behaviour of A356 Al-30 wt.% SiCp MMC A Ravikiran, MK Surappa wear 206 (1-2), 33-38, 1997 | 113 | 1997 |
Fundamental limits of optical critical dimension metrology: a simulation study R Silver, T Germer, R Attota, BM Barnes, B Bunday, J Allgair, E Marx, ... Metrology, Inspection, and Process Control for Microlithography XXI 6518 …, 2007 | 104 | 2007 |
Effect of contact pressure and load on wear of alumina A Ravikiran, S Jahanmir Wear 251 (1-12), 980-984, 2001 | 90 | 2001 |
Scatterfield microscopy for extending the limits of image-based optical metrology RM Silver, BM Barnes, R Attota, J Jun, M Stocker, E Marx, HJ Patrick Applied optics 46 (20), 4248-4257, 2007 | 87 | 2007 |
Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis R Attota, TA Germer, RM Silver Optics Letters 33 (17), 1990-1992, 2008 | 78 | 2008 |
Effect of speed and pressure on dry sliding interactions of alumina against steel A Ravikiran, VS Nagarajan, SK Biswas, BNP Bai Journal of the American Ceramic Society 78 (2), 356-364, 1995 | 68 | 1995 |
Nanometrology using a through-focus scanning optical microscopy method R Attota, R Silver Measurement Science and Technology 22 (2), 024002, 2010 | 51 | 2010 |
TSOM method for semiconductor metrology R Attota, RG Dixson, JA Kramar, JE Potzick, AE Vladár, B Bunday, ... Metrology, Inspection, and Process Control for Microlithography XXV 7971 …, 2011 | 47 | 2011 |
Application of through-focus focus-metric analysis in high resolution optical metrology R Attota, R Silver, T Germer, M Bishop, R Larrabee, M Stocker, L Howard Microlithography 2005 5752, 1441-1449, 2005 | 46* | 2005 |
Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node R Attota, B Bunday, V Vartanian Applied Physics Letters 102 (22), 2013 | 38 | 2013 |
Effect of interface layers formed during dry sliding of zirconia toughened alumina (ZTA) and monolithic alumina against steel A Ravikiran, GR Subbanna, BNP Bai Wear 192 (1-2), 56-65, 1996 | 38 | 1996 |
Wear quantification A Ravikiran J. Trib. 122 (3), 650-656, 2000 | 37 | 2000 |
Oscillations in coefficient of friction during dry sliding of A356 Al-30% wt SiC {sub p} MMC against steel A Ravikiran, MK Surappa Scripta materialia 36 (1), 1997 | 37 | 1997 |
Nanoparticle size determination using optical microscopes R Attota, PP Kavuri, H Kang, R Kasica, L Chen Applied Physics Letters 105 (16), 163105, 2014 | 35 | 2014 |
Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes R Attota, R Dixson Applied Physics Letters 105, 043101, 2014 | 35 | 2014 |
Optical through-focus technique that differentiates small changes in line width, line height, and sidewall angle for CD, overlay, and defect metrology applications R Attota, R Silver, BM Barnes Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008 | 33 | 2008 |
Angle resolved optical metrology RM Silver, BM Barnes, A Heckert, R Attota, R Dixson, J Jun Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008 | 33 | 2008 |
Influence of speed on the tribochemical reaction products and the associated transitions for the dry sliding of silicon nitride against steel A Ravikiran, BNP Bai Journal of the American Ceramic Society 78 (11), 3025-3032, 1995 | 32 | 1995 |
High-resolution optical overlay metrology RM Silver, R Attota, M Stocker, M Bishop, JSJ Jun, E Marx, MP Davidson, ... Metrology, Inspection, and Process Control for Microlithography XVIII 5375 …, 2004 | 30 | 2004 |
Evaluation of new in-chip and arrayed line overlay target designs R Attota, RM Silver, M Bishop, E Marx, JSJ Jun, M Stocker, MP Davidson, ... Metrology, Inspection, and Process Control for Microlithography XVIII 5375 …, 2004 | 28 | 2004 |