| Analysis of the electrical breakdown in hydrogenated amorphous silicon thin-film transistors NT Golo, FG Kuper, TJ Mouthaan IEEE Transactions on Electron Devices 49 (6), 1012-1018, 2002 | 23 | 2002 |
| Transmission line model testing of top-gate amorphous silicon thin film transistors N Tosic, FG Kuper, T Mouthaan 2000 IEEE International Reliability Physics Symposium Proceedings. 38th …, 2000 | 21 | 2000 |
| Reliability testing of power VDMOS transistors N Tosic, B Pesic, N Stojadinovic 1997 21st International Conference on Microelectronics. Proceedings 2, 667-670, 1997 | 15 | 1997 |
| High temperature storage life (HTSL) and high temperature reverse bias (HTRB) reliability testing of power VDMOSFETs N Tosic, B Pesic, N Stojadinovic Proceedings of International Conference on Microelectronics 1, 285-288, 1995 | 12 | 1995 |
| Too dynamic to fail: empirical support for an autocatalytic model of Minsky’s financial instability hypothesis N Golo, DS Brée, G Kelman, L Ussher, M Lamieri, S Solomon Journal of Economic Interaction and Coordination 11, 247-271, 2016 | 11 | 2016 |
| Estimation of the impact of electrostatic discharge on density of states in hydrogenated amorphous silicon thin-film transistors NT Golo, S van der Wal, FG Kuper, T Mouthaan Applied physics letters 80 (18), 3337-3339, 2002 | 10 | 2002 |
| Minsky financial instability, interscale feedback, percolation and Marshall–Walras disequilibrium S Solomon, N Golo Accounting, Economics and Law 3 (3), 167-260, 2013 | 9 | 2013 |
| Zapping thin film transistors NT Golo, FG Kuper, T Mouthaan Microelectronics reliability 42 (4-5), 747-765, 2002 | 9 | 2002 |
| Microeconomic structure determines macroeconomic dynamics: Aoki defeats the representative agent SSN Golo Journal of Economic Interaction and Coordination, 1-26, 2014 | 8 | 2014 |
| High Voltage Effects in Top Gate Amorphous Silicon Thin Film Transistors N Tosic, FG Kuper, T Mouthaan MRS Online Proceedings Library (OPL) 621, Q8. 5.1, 2000 | 8 | 2000 |
| High-temperature-reverse-bias testing of power VDMOS transistors N Tošić, B Pešić, N Stojadinović Microelectronics Reliability 37 (10-11), 1759-1762, 1997 | 8 | 1997 |
| Investigation of failure mechanisms in power VDMOSFETs N Tosic, B Pesic, N Stojadinovic Proceedings of the 1997 6th International Symposium on the Physical and …, 1997 | 8 | 1997 |
| Many-to-one contagion of economic growth rate across trade credit network of firms N Golo, G Kelman, DS Bree, L Usher, M Lamieri, S Solomon arXiv preprint arXiv:1506.01734, 2015 | 7 | 2015 |
| The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors NT Golo, S van der Wal, FG Kuper, T Mouthaan Microelectronics Reliability 41 (9-10), 1391-1396, 2001 | 6 | 2001 |
| A case study of conspiracy theories about Charlie Hebdo terrorist attack N Golo arXiv preprint arXiv:1510.00037, 2015 | 5 | 2015 |
| Conspiratorial beliefs observed through entropy principles N Golo, S Galam Entropy 17 (8), 5611-5634, 2015 | 5 | 2015 |
| Dissortative from the outside, assortative from the inside: Social structure and behavior in the industrial trade network G Kelman, DS Brée, E Manes, M Lamieri, N Golo, S Solomon 2015 48th Hawaii International Conference on System Sciences, 1606-1615, 2015 | 4 | 2015 |
| Electrostatic discharge effects in thin film transistors N Golo Twente University Press, 2002 | 4 | 2002 |
| Dealing with electrostatic discharge in a capacitive fingerprint sensor fabricated in amorphous silicon thin film technology N Golo, T Jenneboer, T Mouthaan Semiconductor Sensor and Actuator Technology, SeSens 2002, 616-621, 2002 | 3 | 2002 |
| How do life, economy and other complex systems escape the heat death? S Solomon, N Golo Entropy 16 (3), 1687-1727, 2014 | 2 | 2014 |
