Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy OL Krivanek, MF Chisholm, V Nicolosi, TJ Pennycook, GJ Corbin, ...
Nature 464 (7288), 571-574, 2010
1429 2010 Sub-ångstrom resolution using aberration corrected electron optics PE Batson, N Dellby, OL Krivanek
Nature 418 (6898), 617-620, 2002
1162 2002 Towards sub-Å electron beams OL Krivanek, N Dellby, AR Lupini
Ultramicroscopy 78 (1-4), 1-11, 1999
786 1999 Surface roughness at the Si(100)- SM Goodnick, DK Ferry, CW Wilmsen, Z Liliental, D Fathy, OL Krivanek
Physical Review B 32 (12), 8171, 1985
752 1985 Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy DA Muller, LF Kourkoutis, M Murfitt, JH Song, HY Hwang, J Silcox, ...
Science 319 (5866), 1073-1076, 2008
742 2008 Vibrational spectroscopy in the electron microscope OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ...
Nature 514 (7521), 209-212, 2014
733 2014 Direct sub-angstrom imaging of a crystal lattice PD Nellist, MF Chisholm, N Dellby, OL Krivanek, MF Murfitt, ZS Szilagyi, ...
Science 305 (5691), 1741-1741, 2004
677 2004 EELS atlas: a reference collection of electron energy loss spectra covering all stable elements CC Ahn, OL Krivanek, RP Burgner, MM Disko, PR Swann
(No Title), 1983
478 1983 Spectroscopic imaging of single atoms within a bulk solid M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ...
Physical Review Letters 92 (9), 095502, 2004
396 2004 An electron microscope for the aberration-corrected era OL Krivanek, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ...
Ultramicroscopy 108 (3), 179-195, 2008
375 2008 ELNES of 3d transition-metal oxides: II. Variations with oxidation state and crystal structure JH Paterson, OL Krivanek
Ultramicroscopy 32 (4), 319-325, 1990
267 1990 Parallel detection electron spectrometer using quadrupole lenses OL Krivanek, CC Ahn, RB Keeney
Ultramicroscopy 22 (1-4), 103-115, 1987
254 1987 Towards sub-0.5 Å electron beams OL Krivanek, PD Nellist, N Dellby, MF Murfitt, Z Szilagyi
Ultramicroscopy 96 (3-4), 229-237, 2003
236 2003 Gentle STEM: ADF imaging and EELS at low primary energies OL Krivanek, N Dellby, MF Murfitt, MF Chisholm, TJ Pennycook, ...
Ultramicroscopy 110 (8), 935-945, 2010
229 2010 Site-specific valence determination by electron energy-loss spectroscopy J Taftø, OL Krivanek
Physical Review Letters 48 (8), 560, 1982
229 1982 Applications of slow-scan CCD cameras in transmission electron microscopy OL Krivanek, PE Mooney
Ultramicroscopy 49 (1-4), 95-108, 1993
210 1993 High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy OL Krivanek, JP Ursin, NJ Bacon, GJ Corbin, N Dellby, P Hrncirik, ...
Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009
199 2009 Lattice imaging of a grain boundary in crystalline germanium OL Krivanek, S Isoda, K Kobayashi
Philosophical Magazine 36 (4), 931-940, 1977
190 1977 Design and first applications of a post-column imaging filter OL Krivanek, AJ Gubbens, N Dellby, CE Meyer
Microscopy Microanalysis Microstructures 3 (2-3), 187-199, 1992
183 1992 Developments in EELS instrumentation for spectroscopy and imaging OL Krivanek, AJ Gubbens, N Dellby
Microscopy Microanalysis Microstructures 2 (2-3), 315-332, 1991
167 1991 