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- Hongsik JeongProfessor of Material Science and Engineering, Ulsan National Institute of Science and TechnologyEmail verificata su mail.tsinghua.edu.cn
- Kyung-Chang RyooSamsung ElectronicsEmail verificata su samsung.com
- Mark LundstromProfessor of Electrical and Computer Engineering, Purdue UniversityEmail verificata su purdue.edu
- Suyoun LeeKorea Institute of Science and TechnologyEmail verificata su kist.re.kr
- Young-Tae Kim삼성전자 반도체연구소 수석연구원Email verificata su samsung.com
- Muhammad Ashraful AlamJai N. Gupta Professor of Electrical Engineering, Purdue UniversityEmail verificata su purdue.edu
- Dae-Hwan KangPohang University of Science and TechnologyEmail verificata su postech.ac.kr
- Jisu RyuSamsung ElectronicsEmail verificata su samsung.com
- Sanghoon MyungSamsung ElectronicsEmail verificata su samsung.com
- In HuhStaff Research Engineer, Samsung ElectronicsEmail verificata su samsung.com
- Supriyo DattaProfessor, Purdue UniversityEmail verificata su purdue.edu
- RASEONG KIMIntel CorporationEmail verificata su intel.com
- Wonik JangSamsung Electronics.Email verificata su samsung.com
- Mohammad Ryyan KhanEmail verificata su ewubd.edu
- Jae Myung ChoePrinciple Engineer, Samsung ElectronicsEmail verificata su samsung.com
- Suprem R. DasAssistant Professor, Kansas State UniversityEmail verificata su ksu.edu
- Jang-Sik LeeProfessor of Materials Science and Engineering, Pohang University of Science and Technology (POSTECHEmail verificata su postech.ac.kr
- Pradeep NairProfessor, Dept of Electrical Engineering, IIT BombayEmail verificata su ee.iitb.ac.in
- Hyun Cheol KooKorea Institute of Science and TechnologyEmail verificata su kist.re.kr
- Bohyung HanProfessor, Seoul National UniversityEmail verificata su snu.ac.kr