Arnaud Virazel
Arnaud Virazel
LIRMM - Univ. Montpellier / CNRS
Email verificata su lirmm.fr - Home page
Titolo
Citata da
Citata da
Anno
Advanced test methods for SRAMs: effective solutions for dynamic fault detection in nanoscaled technologies
A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel
Springer Science & Business Media, 2009
85*2009
Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test Solution
L Dilillo, P Girard, S Pravossoudovitch, A Virazel, S Borri, ...
ETS: European Test Symposium, 140-145, 2004
812004
A study of tapered 3-D TSVs for power and thermal integrity
A Todri, S Kundu, P Girard, A Bosio, L Dilillo, A Virazel
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (2), 306-319, 2012
802012
Resistive-open defects in embedded-SRAM core cells: Analysis and march test solution
L Dilillo, P Girard, S Pravossoudovitch, A Virazel, S Borri, M Hage-Hassan
13th Asian test symposium, 266-271, 2004
772004
Design of routing-constrained low power scan chains
Y Bonhomme, P Girard, L Guiller, C Landrault, S Pravossoudovitch, ...
Proceedings Design, Automation and Test in Europe Conference and Exhibitioná…, 2004
742004
Using TMR architectures for yield improvement
J Vial, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSIá…, 2008
732008
Minimizing peak power consumption during scan testing: Test pattern modification with X filling heuristics
N Badereddine, P Girard, S Pravossoudovitch, C Landrault, A Virazel, ...
International Conference on Design and Test of Integrated Systems iná…, 2006
622006
Delay fault testing: Choosing between random SIC and random MIC test sequences
A Virazel, R David, P Girard, C Landrault, S Pravossoudovitch
Journal of Electronic Testing 17 (3), 233-241, 2001
542001
Defect-oriented dynamic fault models for embedded-SRAMs
S Borri, M Hage-Hassan, P Girard, S Pravossoudovitch, A Virazel
The Eighth IEEE European Test Workshop, 2003. Proceedings., 23-28, 2003
492003
High defect coverage with low-power test sequences in a BIST environment
P Girard, C Landrault, S Pravossoudovitch, A Virazel, HJ Wunderlich
IEEE Design & Test of Computers 19 (5), 44-52, 2002
482002
Multiple cell upset classification in commercial SRAMs
G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ...
IEEE Transactions on Nuclear Science 61 (4), 1747-1754, 2014
442014
Analysis of dynamic faults in embedded-SRAMs: Implications for memory test
S Borri, M Hage-Hassan, L Dilillo, P Girard, S Pravossoudovitch, A Virazel
Journal of Electronic Testing 21 (2), 169-179, 2005
442005
Data retention fault in SRAM memories: Analysis and detection procedures
L Dilillo, P Girard, S Pravossoudovitch, A Virazel, MB Hage-Hassan
23rd IEEE VLSI Test Symposium (VTS'05), 183-188, 2005
422005
Efficient march test procedure for dynamic read destructive fault detection in SRAM memories
L Dilillo, P Girard, S Pravossoudovitch, A Virazel, S Borri, M Hage-Hassan
Journal of Electronic Testing 21 (5), 551-561, 2005
412005
Derric: A tool for unified logic diagnosis
A Rousset, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel
12th IEEE European Test Symposium (ETS'07), 13-20, 2007
392007
Testing a commercial MRAM under neutron and alpha radiation in dynamic mode
G Tsiligiannis, L Dilillo, A Bosio, P Girard, A Todri, A Virazel, SS McClure, ...
IEEE Transactions on Nuclear Science 60 (4), 2617-2622, 2013
352013
March iC-: an improved version of March C-for ADOFs detection
L Dilillo, P Girard, S Pravossoudovitch, A Virazel, S Borri
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 129-134, 2004
322004
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 μm and 90 nm technologies
L Dilillo, P Girard, S Pravossoudovitch, A Virazel, M Bastian
Proceedings of the 42nd annual Design Automation Conference, 857-862, 2005
302005
Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes
RA Fonseca, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Virazel, ...
2010 15th IEEE European Test Symposium, 132-137, 2010
272010
Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization
L Dilillo, P Girard, S Pravossoudovitch, A Virazel, MB Hage-Hassan
European Test Symposium (ETS'05), 116-121, 2005
272005
Il sistema al momento non pu˛ eseguire l'operazione. Riprova pi¨ tardi.
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