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Andrea Leonardo Lacaita
Andrea Leonardo Lacaita
Email verificata su polimi.it
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Citata da
Citata da
Anno
Avalanche photodiodes and quenching circuits for single-photon detection
S Cova, M Ghioni, A Lacaita, C Samori, F Zappa
Applied optics 35 (12), 1956-1976, 1996
15321996
Electronic switching in phase-change memories
A Pirovano, AL Lacaita, A Benvenuti, F Pellizzer, R Bez
IEEE Transactions on Electron Devices 51 (3), 452-459, 2004
7582004
Novel/spl mu/trench phase-change memory cell for embedded and stand-alone non-volatile memory applications
F Pellizzer, A Pirovano, F Ottogalli, M Magistretti, M Scaravaggi, P Zuliani, ...
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004., 18-19, 2004
5432004
Self-accelerated thermal dissolution model for reset programming in unipolar resistive-switching memory (RRAM) devices
U Russo, D Ielmini, C Cagli, AL Lacaita
IEEE Transactions on Electron Devices 56 (2), 193-200, 2009
5182009
Reliability study of phase-change nonvolatile memories
A Pirovano, A Redaelli, F Pellizzer, F Ottogalli, M Tosi, D Ielmini, ...
IEEE Transactions on Device and Materials Reliability 4 (3), 422-427, 2004
5052004
Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials
A Pirovano, AL Lacaita, F Pellizzer, SA Kostylev, A Benvenuti, R Bez
IEEE Transactions on Electron Devices 51 (5), 714-719, 2004
4462004
On the bremsstrahlung origin of hot-carrier-induced photons in silicon devices
AL Lacaita, F Zappa, S Bigliardi, M Manfredi
IEEE Transactions on electron devices 40 (3), 577-582, 1993
4291993
Filament conduction and reset mechanism in NiO-based resistive-switching memory (RRAM) devices
U Russo, D Ielmini, C Cagli, AL Lacaita
IEEE Transactions on Electron Devices 56 (2), 186-192, 2009
4282009
Phase change memories: State-of-the-art, challenges and perspectives
AL Lacaita
Solid-State Electronics 50 (1), 24-31, 2006
4102006
Frequency dependence on bias current in 5 GHz CMOS VCOs: Impact on tuning range and flicker noise upconversion
S Levantino, C Samori, A Bonfanti, SLJ Gierkink, AL Lacaita, V Boccuzzi
IEEE Journal of Solid-State Circuits 37 (8), 1003-1011, 2002
3822002
Study of multilevel programming in programmable metallization cell (PMC) memory
U Russo, D Kamalanathan, D Ielmini, AL Lacaita, MN Kozicki
IEEE transactions on electron devices 56 (5), 1040-1047, 2009
3762009
Electronic switching effect and phase-change transition in chalcogenide materials
A Redaelli, A Pirovano, F Pellizzer, AL Lacaita, D Ielmini, R Bez
IEEE Electron Device Letters 25 (10), 684-686, 2004
3622004
Scaling analysis of phase-change memory technology
A Pirovano, AL Lacaita, A Benvenuti, F Pellizzer, S Hudgens, R Bez
IEEE International Electron Devices Meeting 2003, 29.6. 1-29.6. 4, 2003
3502003
Electrothermal and phase-change dynamics in chalcogenide-based memories
AL Lacaita, A Redaelli, D Ielmini, F Pellizzer, A Pirovano, A Benvenuti, ...
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004…, 2004
3342004
Recovery and drift dynamics of resistance and threshold voltages in phase-change memories
D Ielmini, AL Lacaita, D Mantegazza
IEEE Transactions on Electron Devices 54 (2), 308-315, 2007
3262007
A 13.5-mW 5-GHz frequency synthesizer with dynamic-logic frequency divider
S Pellerano, S Levantino, C Samori, AL Lacaita
IEEE Journal of Solid-State Circuits 39 (2), 378-383, 2004
3242004
Trapping phenomena in avalanche photodiodes on nanosecond scale
S Cova, A Lacaita, G Ripamonti
IEEE Electron device letters 12 (12), 685-687, 1991
3111991
A 2.9–4.0-GHz Fractional-N Digital PLL With Bang-Bang Phase Detector and 560-Integrated Jitter at 4.5-mW Power
D Tasca, M Zanuso, G Marzin, S Levantino, C Samori, AL Lacaita
IEEE Journal of Solid-State Circuits 46 (12), 2745-2758, 2011
2942011
Threshold switching and phase transition numerical models for phase change memory simulations
A Redaelli, A Pirovano, A Benvenuti, AL Lacaita
Journal of Applied Physics 103 (11), 2008
2682008
Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM
U Russo, D Ielmini, C Cagli, AL Lacaita, S Spiga, C Wiemer, M Perego, ...
2007 IEEE International Electron Devices Meeting, 775-778, 2007
2592007
Il sistema al momento non pu eseguire l'operazione. Riprova pi tardi.
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