Matteo Leoni
Matteo Leoni
Verified email at unitn.it
TitleCited byYear
Whole powder pattern modelling
P Scardi, M Leoni
Acta Crystallographica Section A: Foundations of Crystallography 58 (2), 190-200, 2002
5182002
Diffraction analysis of the microstructure of materials
EJ Mittemeijer, P Scardi
Springer Science & Business Media, 2013
341*2013
Line broadening analysis using integral breadth methods: a critical review
P Scardi, M Leoni, R Delhez
Journal of applied crystallography 37 (3), 381-390, 2004
3032004
PM2K: a flexible program implementing Whole Powder Pattern Modelling
M Leoni, T Confente, P Scardi
Z. Kristallogr. Suppl 23, 249-254, 2006
2222006
Diffraction line profiles from polydisperse crystalline systems
P Scardi, M Leoni
Acta Crystallographica Section A: Foundations of Crystallography 57 (5), 604-613, 2001
1982001
Solar photoactivity of nano-N-TiO2 from tertiary amine: role of defects and paramagnetic species
F Spadavecchia, G Cappelletti, S Ardizzone, CL Bianchi, S Cappelli, ...
Applied Catalysis B: Environmental 96 (3-4), 314-322, 2010
1562010
Thermal diffusivity/microstructure relationship in Y-PSZ thermal barrier coatings
F Cernuschi, P Bianchi, M Leoni, P Scardi
Journal of Thermal Spray Technology 8 (1), 102-109, 1999
1431999
Tubular‐Shaped Stoichiometric Chrysotile Nanocrystals
G Falini, E Foresti, M Gazzano, AF Gualtieri, M Leoni, IG Lesci, N Roveri
Chemistry–A European Journal 10 (12), 3043-3049, 2004
1342004
Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects
P Scardi, M Leoni
Journal of applied crystallography 32 (4), 671-682, 1999
1291999
Line profile analysis: pattern modelling versus profile fitting
P Scardi, M Leoni
Journal of applied crystallography 39 (1), 24-31, 2006
1272006
Phase stability of scandia–yttria-stabilized zirconia TBCs
M Leoni, RL Jones, P Scardi
Surface and coatings technology 108, 107-113, 1998
901998
Nanocrystalline domain size distributions from powder diffraction data
M Leoni, P Scardi
Journal of applied crystallography 37 (4), 629-634, 2004
882004
Simultaneous refinement of structure and microstructure of layered materials
M Leoni, AF Gualtieri, N Roveri
Journal of Applied Crystallography 37 (1), 166-173, 2004
852004
(Ti, Cr) N and Ti/TiN PVD coatings on 304 stainless steel substrates: Texture and residual stress
M Leoni, P Scardi, S Rossi, L Fedrizzi, Y Massiani
Thin Solid Films 345 (2), 263-269, 1999
801999
The determination of stresses in thin films; modelling elastic grain interaction
U Welzel, M Leoni, EJ Mittemeijer
Philosophical Magazine 83 (5), 603-630, 2003
772003
Dislocation effects in powder diffraction
M Leoni, J Martinez-Garcia, P Scardi
Journal of Applied Crystallography 40 (4), 719-724, 2007
732007
X‐ray Diffraction Methodology for the Microstructural Analysis of Nanocrystalline Powders: Application to Cerium Oxide
M Leoni, R Di Maggio, S Polizzi, P Scardi
Journal of the American Ceramic Society 87 (6), 1133-1140, 2004
732004
MOCVD Growth and Characterization of ZrO2 Thin Films Obtained from Unusual Organo‐Zirconium Precursors
S Codato, G Carta, G Rossetto, GA Rizzi, P Zanella, P Scardi, M Leoni
Chemical Vapor Deposition 5 (4), 159-164, 1999
691999
Residual stresses in plasma sprayed partially stabilised zirconia TBCs: influence of the deposition temperature
P Scardi, M Leoni, L Bertamini
Thin Solid Films 278 (1-2), 96-103, 1996
681996
Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure
P Scardi, M Leoni, YH Dong
The European Physical Journal B-Condensed Matter and Complex Systems 18 (1†…, 2000
672000
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Articles 1–20