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Shida Tan
Shida Tan
Email verificata su intel.com
Titolo
Citata da
Citata da
Anno
Subsurface damage from helium ions as a function of dose, beam energy, and dose rate
R Livengood, S Tan, Y Greenzweig, J Notte, S McVey
Journal of Vacuum Science & Technology B: Microelectronics and Nanometerá…, 2009
2182009
Optical trapping of single-walled carbon nanotubes
S Tan, HA Lopez, CW Cai, Y Zhang
Nano Letters 4 (8), 1415-1419, 2004
1382004
The prospects of a subnanometer focused neon ion beam
FHM Rahman, S McVey, L Farkas, JA Notte, S Tan, RH Livengood
Scanning 34 (2), 129-134, 2012
782012
Gas field ion source and liquid metal ion source charged particle material interaction study for semiconductor nanomachining applications
S Tan, R Livengood, D Shima, J Notte, S McVey
Journal of Vacuum Science & Technology B, Nanotechnology andá…, 2010
662010
Aqueous two-phase system of cationic and anionic surfactant mixture and its application to the extraction of porphyrins and metalloporphyrins
A Tong, Y Wu, S Tan, L Li, Y Akama, S Tanaka
Analytica chimica acta 369 (1-2), 11-16, 1998
641998
Nanomachining with a focused neon beam: A preliminary investigation for semiconductor circuit editing and failure analysis
S Tan, R Livengood, P Hack, R Hallstein, D Shima, J Notte, S McVey
Journal of Vacuum Science & Technology B, Nanotechnology andá…, 2011
452011
The neon gas field ion source—a first characterization of neon nanomachining properties
RH Livengood, S Tan, R Hallstein, J Notte, S McVey, FHMF Rahman
Nuclear Instruments and Methods in Physics Research Section A: Acceleratorsá…, 2011
442011
Probe current distribution characterization technique for focused ion beam
S Tan, R Livengood, Y Greenzweig, Y Drezner, D Shima
Journal of Vacuum Science & Technology B, Nanotechnology andá…, 2012
422012
In situ mitigation of subsurface and peripheral focused ion beam damage via simultaneous pulsed laser heating
MG Stanford, BB Lewis, V Iberi, JD Fowlkes, S Tan, R Livengood, ...
Small 12 (13), 1779-1787, 2016
342016
Mechanism and applications of helium transmission milling in thin membranes
Shida Tan, Kate Klein, Darryl Shima, Rick Livengood, Eva Mutunga, Andrßs Vladßr
Journal of Vacuum Science & Technology B 32, 06FA01, 2014
322014
Current density profile characterization and analysis method for focused ion beam
Y Greenzweig, Y Drezner, S Tan, RH Livengood, A Raveh
Microelectronic Engineering 155, 19-24, 2016
302016
Noble gas ion beams in materials science for future applications and devices
A Belianinov, MJ Burch, S Kim, S Tan, G Hlawacek, OS Ovchinnikova
Mrs Bulletin 42 (9), 660-666, 2017
282017
Monte Carlo simulations of nanoscale focused neon ion beam sputtering of copper: elucidating resolution limits and sub-surface damage
R Timilsina, S Tan, R Livengood, PD Rack
Nanotechnology 25 (48), 485704, 2014
282014
Resolution multiplication technique for projection display systems
AK Bhowmik, S Tan, JA Bonnington
US Patent 7,325,928, 2008
272008
Laser-Assisted Focused He+ Ion Beam Induced Etching with and without XeF2 Gas Assist
MG Stanford, K Mahady, BB Lewis, JD Fowlkes, S Tan, R Livengood, ...
ACS applied materials & interfaces 8 (42), 29155-29162, 2016
252016
Carbon nanotube interconnects in porous diamond interlayer dielectrics
KV Ravi, T Shida, J Maveety
US Patent 7,365,003, 2008
182008
Simulating advanced focused ion beam nanomachining: a quantitative comparison of simulation and experimental results
KT Mahady, S Tan, Y Greenzweig, A Raveh, PD Rack
Nanotechnology 29 (49), 495301, 2018
162018
Monte Carlo simulations of nanoscale Ne+ ion beam sputtering: investigating the influence of surface effects, interstitial formation, and the nanostructural evolution
K Mahady, S Tan, Y Greenzweig, R Livengood, A Raveh, P Rack
Nanotechnology 28 (4), 045305, 2016
162016
The neon gas field ion source-stability and lifetime
J Notte, F Rahman, SM McVey, S Tan, R Livengood
Microscopy and Microanalysis 16 (S2), 28-29, 2010
162010
Enhanced photoluminescence in a novel photobleached dithienylbenzo [c] thiophene oligomer derivative
S Tan, AK Bhowmik, M Thakur, MV Lakshmikantham, MP Cava
The Journal of Chemical Physics 112 (1), 383-385, 2000
162000
Il sistema al momento non pu˛ eseguire l'operazione. Riprova pi¨ tardi.
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