| Atomic layer deposition of ruthenium and ruthenium oxide using a zero-oxidation state precursor DZ Austin, MA Jenkins, D Allman, S Hose, D Price, CL Dezelah, ... Chemistry of Materials 29 (3), 1107-1115, 2017 | 74 | 2017 |
| Beyond the highs and lows: A perspective on the future of dielectrics research for nanoelectronic devices M Jenkins, DZ Austin, JF Conley, J Fan, CH De Groot, L Jiang, Y Fan, ... ECS Journal of Solid State Science and Technology 8 (11), N159, 2019 | 25 | 2019 |
| Demonstration of Fowler–Nordheim tunneling in simple solution-processed thin films CK Perkins, MA Jenkins, TH Chiang, RH Mansergh, V Gouliouk, ... ACS applied materials & interfaces 10 (42), 36082-36087, 2018 | 21 | 2018 |
| Minerals to materials: Bulk synthesis of aqueous aluminum clusters and their use as precursors for metal oxide thin films BL Fulton, CK Perkins, RH Mansergh, MA Jenkins, V Gouliouk, ... Chemistry of Materials 29 (18), 7760-7765, 2017 | 21 | 2017 |
| Enhanced NMR with Optical Pumping Yields 75As Signals Selectively from a Buried GaAs Interface MM Willmering, ZL Ma, MA Jenkins, JF Conley Jr, SE Hayes Journal of the American Chemical Society 139 (11), 3930-3933, 2017 | 16 | 2017 |
| Assessment of energy barriers between ZrCuAlNi amorphous metal and atomic layer deposition insulators using internal photoemission spectroscopy MA Jenkins, T Klarr, DZ Austin, W Li, NV Nguyen, JF Conley Jr physica status solidi (RRL)–Rapid Research Letters 12 (3), 1700437, 2018 | 14 | 2018 |
| Internal photoemission spectroscopy determination of barrier heights between Ta-based amorphous metals and atomic layer deposited insulators MA Jenkins, JM McGlone, JF Wager, JF Conley Journal of Applied Physics 125 (5), 2019 | 12 | 2019 |
| Determination of hafnium zirconium oxide interfacial band alignments using internal photoemission spectroscopy and X-ray photoelectron spectroscopy MA Jenkins, KEK Holden, SW Smith, MT Brumbach, MD Henry, ... ACS Applied Materials & Interfaces 13 (12), 14634-14643, 2021 | 10 | 2021 |
| Laminate Al2O3/Ta2O5 Metal/Insulator/Insulator/Metal (MIIM) Devices for High-Voltage Applications MA Jenkins, DZ Austin, KEK Holden, D Allman, JF Conley IEEE Transactions on Electron Devices 66 (12), 5260-5265, 2019 | 7 | 2019 |
| Characterization of atomic layer deposited cobalt oxide KEK Holden, MA Jenkins, JF Conley ECS Transactions 85 (13), 735, 2018 | 7 | 2018 |
| Improved properties of atomic layer deposited ruthenium via postdeposition annealing M Hayes, MA Jenkins, J Woodruff, DF Moser, CL Dezelah, JF Conley Journal of Vacuum Science & Technology A 39 (5), 2021 | 6 | 2021 |
| Contributions to the biology of the Inner Fame TE Thompson, ST Smith, M Jenkins, K Benson-Evans, D Fisk, G Morgan, ... Transnat. Hist. Soc. Northumb.(NS) 15, 197-225, 1966 | 5 | 1966 |
| Correction to Atomic Layer Deposition of Ruthenium and Ruthenium Oxide Using a Zero Oxidation State Precursor DZ Austin, MA Jenkins, D Allman, S Hose, D Price, CL Dezelah, ... Chemistry of Materials 30 (24), 8983-8984, 2018 | 4 | 2018 |
| Internal Photoemission Spectroscopy Measurements of the Energy Barrier Heights between ALD SiO2 and Ta-Based Amorphous Metals MA Jenkins, T Klarr, JM McGlone, JF Wager, JF Conley ECS Transactions 85 (13), 729, 2018 | 3 | 2018 |
| Erratum:“The ‘Generalized Skettrup Model’and Lattice Thermal Capacity of Graphene, h-BN, MoS2, and WS2 Flakes” by Valeri Ligatchev [ECS J. Solid State Sci. Technol. 9 093014 … M Jenkins, DZ Austin, JF Conley | | 2021 |
| Investigation of Energy Barrier Heights within Metal-insulator-metal Devices via Internal Photoemission Spectroscopy MA Jenkins | | 2019 |
| 3 INTERNAL PHOTOEMISSION SPECTROSCOPY DETERMINATION OF BARRIER HEIGHTS BETWEEN TA-BASED AMORPHOUS METALS AND ATOMIC LAYER DEPOSITED INSULATORS MA Jenkins, JM McGlone, JF Wager, JF Conley Jr Investigation of Energy Barrier Heights within Metal-insulator-metal Devices …, 2019 | | 2019 |
| Internal Photoemission Spectroscopy Measurements of the Energy Barrier Heights between ALD Dielectrics and Ta-Based Amorphous Metals MA Jenkins, T Klarr, JM McGlone, JF Wager, JF Conley Jr Electrochemical Society Meeting Abstracts 233, 1186-1186, 2018 | | 2018 |
| Characterization of Low-Temperature Atomic Layer Deposited Cobalt Oxide KEK Holden, MA Jenkins, JF Conley Jr Electrochemical Society Meeting Abstracts 233, 1187-1187, 2018 | | 2018 |
| 4 INTERNAL PHOTOEMISSION SPECTROSCOPY MEASUREMENT OF BARRIER HEIGHTS BETWEEN ATOMIC LAYER DEPOSITED (ALD) RU AND ALD INSULATORS MA Jenkins, MH Hayes, JF Conley Jr Investigation of Energy Barrier Heights within Metal-insulator-metal Devices …, 0 | | |
John F. Conley, Jr.Professor of Electrical Engineering and Computer Science, Oregon State UniversityEmail verificata su eecs.oregonstate.edu
