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- Thomas LipoUniversity of WisconsinEmail verificata su engr.wisc.edu
- JiangBiao HeUniversity of Kentucky, GE Global ResearchEmail verificata su uky.edu
- Ayman EL-RefaieMarquette UniversityEmail verificata su marquette.edu
- Tsarafidy RAMINOSOASenior R&D Staff, Oak Ridge National LaboratoryEmail verificata su ornl.gov
- David TorreyGE Global ResearchEmail verificata su ge.com
- Patel Bhageerath ReddyLead Engineer, General Electric Global Research CenterEmail verificata su ieee.org
- Karthik Kumar BodlaHolo Inc.Email verificata su holoam.com
- Tomas SadilekDelta Electronics R&D, GE Global Research, NCSU (FREEDM), UW-Madison (WEMPEC)Email verificata su ge.com
- Nathaniel HawesElectrical Engineer, General Electric Global ResearchEmail verificata su ge.com
- Min ZouLab MagneticsEmail verificata su labmagnetics.com
- Lijun HeGeneral Electric Global Research CenterEmail verificata su ge.com
- Wei QiaoClyde Hyde Professor (IEEE Fellow), Department of Electrical and Computer Engineering, University ofEmail verificata su unl.edu
- Sachin MadhusoodhananSenior Staff Application Engineer, Infineon TechnologiesEmail verificata su infineon.com
- Gilsu ChoiGeneral MotorsEmail verificata su gm.com
- Bulent SarliogluUniversity of Wisconsin-MadisonEmail verificata su engr.wisc.edu
- Cong LiGE Global Research CenterEmail verificata su buckeyemail.osu.edu