Teodor Gotszalk
Teodor Gotszalk
Email verificata su pwr.edu.pl - Home page
Titolo
Citata da
Citata da
Anno
Piezoresistive sensors for scanning probe microscopy
T Gotszalk, P Grabiec, IW Rangelow
Ultramicroscopy 82 (1-4), 39-48, 2000
1262000
Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers
R Linnemann, T Gotszalk, IW Rangelow, P Dumania, E Oesterschulze
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
1061996
Micromachined atomic force microscopy sensor with integrated piezoresistive sensor and thermal bimorph actuator for high-speed tapping-mode atomic force microscopy phase …
R Pedrak, T Ivanov, K Ivanova, T Gotszalk, N Abedinov, IW Rangelow, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003
1022003
Micromachined piezoresistive cantilever array with integrated resistive microheater for calorimetry and mass detection
N Abedinov, P Grabiec, T Gotszalk, T Ivanov, J Voigt, IW Rangelow
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (6 …, 2001
982001
Characterization of a cantilever with an integrated deflection sensor
R Linnemann, T Gotszalk, L Hadjiiski, IW Rangelow
Thin Solid Films 264 (2), 159-164, 1995
901995
Novel high resolution scanning thermal probe
K Edinger, T Gotszalk, IW Rangelow
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001
772001
Thermal nano-probe
IW Rangelow, T Gotszalk, P Grabiec, K Edinger, N Abedinov
Microelectronic engineering 57, 737-748, 2001
632001
Gas‐Sensitive Properties of Nitrogen‐Rich Carbon Nitride Films
LM Zambov, C Popov, N Abedinov, MF Plass, W Kulisch, T Gotszalk, ...
Advanced Materials 12 (9), 656-660, 2000
632000
Piezoresistive and self-actuated 128-cantilever arrays for nanotechnology applications
IW Rangelow, T Ivanov, K Ivanova, BE Volland, P Grabiec, Y Sarov, ...
Microelectronic engineering 84 (5-8), 1260-1264, 2007
552007
Chemical gas sensors based on calixarene-coated discontinuous gold films
D Filenko, T Gotszalk, Z Kazantseva, O Rabinovych, I Koshets, Y Shirshov, ...
Sensors and Actuators B: Chemical 111, 264-270, 2005
542005
Thermally driven micromechanical beam with piezoresistive deflection readout
T Ivanov, T Gotszalk, P Grabiec, E Tomerov, IW Rangelow
Microelectronic engineering 67, 550-556, 2003
542003
Scanning proximal probes for parallel imaging and lithography
K Ivanova, Y Sarov, T Ivanov, A Frank, J Zöllner, C Bitterlich, U Wenzel, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008
532008
Application of piezoelectric tuning forks in liquid viscosity and density measurements
K Waszczuk, T Piasecki, K Nitsch, T Gotszalk
Sensors and Actuators B: Chemical 160 (1), 517-523, 2011
512011
Quantum size aspects of the piezoresistive effect in ultra thin piezoresistors
T Ivanov, T Gotszalk, T Sulzbach, IW Rangelow
Ultramicroscopy 97 (1-4), 377-384, 2003
482003
Vertical devices of self-assembled hybrid organic/inorganic monolayers based on tungsten polyoxometalates
E Makarona, E Kapetanakis, DM Velessiotis, A Douvas, P Argitis, ...
Microelectronic Engineering 85 (5-6), 1399-1402, 2008
442008
Pattern-generation and pattern-transfer for single-digit nano devices
IW Rangelow, A Ahmad, T Ivanov, M Kaestner, Y Krivoshapkina, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2016
402016
Fabrication of piezoresistive-sensed AFM cantilever probe with integrated tip
IW Rangelow, F Shi, P Hudek, T Gotszalk, PB Grabiec, P Dumania
Micromachining and Microfabrication Process Technology II 2879, 56-64, 1996
401996
Calibration and examination of piezoresistive Wheatstone bridge cantilevers for scanning probe microscopy
T Gotszalk, P Grabiec, IW Rangelow
Ultramicroscopy 97 (1-4), 385-389, 2003
372003
Novel SThM nanoprobe for thermal properties investigation of micro-and nanoelectronic devices
P Janus, D Szmigiel, M Weisheit, G Wielgoszewski, Y Ritz, P Grabiec, ...
Microelectronic Engineering 87 (5-8), 1370-1374, 2010
362010
SNOM/AFM microprobe integrated with piezoresistive cantilever beam for multifunctional surface analysis
P Grabiec, T Gotszalk, J Radojewski, K Edinger, N Abedinov, ...
Microelectronic engineering 61, 981-986, 2002
362002
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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