| Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ... Acm Sigplan Notices 49 (6), 259-269, 2014 | 1392 | 2014 |
| Effective inter-component communication mapping in android: An essential step towards holistic security analysis D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon Presented as part of the 22nd {USENIX} Security Symposium ({USENIX} Security …, 2013 | 425 | 2013 |
| Iccta: Detecting inter-component privacy leaks in android apps L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ... 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 406 | 2015 |
| Refactoring UML models G Sunyé, D Pollet, Y Le Traon, JM Jézéquel International Conference on the Unified Modeling Language, 134-148, 2001 | 367 | 2001 |
| Automatic test generation: A use case driven approach C Nebut, F Fleurey, Y Le Traon, JM Jezequel IEEE Transactions on Software Engineering 32 (3), 140-155, 2006 | 358 | 2006 |
| Automated and scalable t-wise test case generation strategies for software product lines G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon 2010 Third international conference on software testing, verification and …, 2010 | 239 | 2010 |
| Dexpler: converting android dalvik bytecode to jimple for static analysis with soot A Bartel, J Klein, Y Le Traon, M Monperrus Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012 | 221 | 2012 |
| Improving test suites for efficient fault localization B Baudry, F Fleurey, Y Le Traon Proceedings of the 28th international conference on Software engineering, 82-91, 2006 | 210 | 2006 |
| Androzoo: Collecting millions of android apps for the research community K Allix, TF Bissyandé, J Klein, Y Le Traon 2016 IEEE/ACM 13th Working Conference on Mining Software Repositories (MSR …, 2016 | 200 | 2016 |
| Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon IEEE Transactions on Software Engineering 40 (7), 650-670, 2014 | 186 | 2014 |
| Efficient object-oriented integration and regression testing Y Le Traon, T Jéron, JM Jézéquel, P Morel IEEE Transactions on Reliability 49 (1), 12-25, 2000 | 160 | 2000 |
| Metamodel-based test generation for model transformations: an algorithm and a tool E Brottier, F Fleurey, J Steel, B Baudry, Y Le Traon 2006 17th International Symposium on Software Reliability Engineering, 85-94, 2006 | 157 | 2006 |
| Pairwise testing for software product lines: comparison of two approaches G Perrouin, S Oster, S Sen, J Klein, B Baudry, Y Le Traon Software Quality Journal 20 (3-4), 605-643, 2012 | 155 | 2012 |
| Barriers to systematic model transformation testing B Baudry, S Ghosh, F Fleurey, R France, Y Le Traon, JM Mottu Communications of the ACM 53 (6), 139-143, 2010 | 154 | 2010 |
| A state-of the-art survey & testbed of fuzzy AHP (FAHP) applications S Kubler, J Robert, W Derigent, A Voisin, Y Le Traon Expert Systems with Applications 65, 398-422, 2016 | 151 | 2016 |
| Automatically securing permission-based software by reducing the attack surface: An application to android A Bartel, J Klein, Y Le Traon, M Monperrus 2012 Proceedings of the 27th IEEE/ACM International Conference on Automated …, 2012 | 150 | 2012 |
| Trivial compiler equivalence: A large scale empirical study of a simple, fast and effective equivalent mutant detection technique M Papadakis, Y Jia, M Harman, Y Le Traon 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 135 | 2015 |
| Combining multi-objective search and constraint solving for configuring large software product lines C Henard, M Papadakis, M Harman, Y Le Traon 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015 | 127 | 2015 |
| Testability analysis of a UML class diagram B Baudry, Y Le Traon, G Sunyé Proceedings Eighth IEEE Symposium on Software Metrics, 54-63, 2002 | 114 | 2002 |
| Metallaxis‐FL: mutation‐based fault localization M Papadakis, Y Le Traon Software Testing, Verification and Reliability 25 (5-7), 605-628, 2015 | 113 | 2015 |
Jacques KleinUniversity of Luxembourg / SnTVerified email at uni.lu
