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- avik W ghoshProfessor, University of Virginia, Electrical EngineeringEmail verificata su virginia.edu
- K M Masum HabibIntel Corp.Email verificata su ee.ucr.edu
- James C. HoneDepartment of Mechanical Engineering, Columbia UniversityEmail verificata su columbia.edu
- Lei WangColumbia UniversityEmail verificata su columbia.edu
- Cory R. DeanColumbia UnviersityEmail verificata su phys.columbia.edu
- T.TaniguchiNational Institute for Materials ScienceEmail verificata su nims.go.jp
- Yuanda GaoIntel Corporation, Columbia UniversityEmail verificata su columbia.edu
- Bo WenResearch Staff Member, IBMEmail verificata su us.ibm.com
- Zheng (Vitto) HANShanxi UniversityEmail verificata su sxu.edu.cn
- Shaowen ChenHarvard UniversityEmail verificata su g.harvard.edu
- Gil-Ho LeePOSTECH (Pohang University of Science and Technology)Email verificata su postech.ac.kr
- Philip KimHarvard UniversityEmail verificata su g.harvard.edu
- Kawser AhmedDevice Engineer, Intel CorporationEmail verificata su intel.com
- Pratik AgnihotriIntel Corp.Email verificata su intel.com
- Ross, F. M.MITEmail verificata su mit.edu
- Alexander KerelskyGoogleEmail verificata su google.com
- Abhay PasupathyProfessor of Physics, Columbia University and Group Leader, Brookhaven National LaboratoryEmail verificata su columbia.edu
- N. Scott BarkerProfessor of Electrical and Computer Engineering, University of VirginiaEmail verificata su virginia.edu
- Yaohua TanUniversity of VirginiaEmail verificata su purdue.edu
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