| Bridging the gap between physical and circuit analysis for variability-aware microwave design: Modeling approaches S Donati Guerrieri, C Ramella, E Catoggio, F Bonani Electronics 11 (6), 860, 2022 | 10 | 2022 |
| Efficient TCAD thermal analysis of semiconductor devices E Catoggio, SD Guerrieri, F Bonani IEEE Transactions on Electron Devices 68 (11), 5462-5468, 2021 | 9 | 2021 |
| Thermal modeling of RF FinFET PAs through temperature-dependent X-parameters extracted from physics-based simulations E Catoggio, SD Guerrieri, C Ramella, F Bonani 2022 International Workshop on Integrated Nonlinear Microwave and Millimetre …, 2022 | 5 | 2022 |
| TCAD modeling of GaN HEMT output admittance dispersion through trap rate equation Green’s functions E Catoggio, S Donati Guerrieri, F Bonani Electronics 12 (11), 2457, 2023 | 4 | 2023 |
| TCAD simulation of microwave circuits: The Doherty amplifier SD Guerrieri, E Catoggio, F Bonani Solid-State Electronics 197, 108445, 2022 | 3 | 2022 |
| TCAD-based dynamic thermal X-parameters for PA self-heating analysis SD Guerrieri, C Ramella, E Catoggio, F Bonani 2022 17th European Microwave Integrated Circuits Conference (EuMIC), 13-16, 2022 | 2 | 2022 |
| Analysis of Doherty Power Amplifier Matching Assisted by Physics-Based Device Modelling S Donati Guerrieri, E Catoggio, F Bonani Electronics 12 (9), 2101, 2023 | 1 | 2023 |
| Bridging the gap between physical and circuit analysis for variability-aware microwave design: power amplifier design S Donati Guerrieri, C Ramella, E Catoggio, F Bonani Electronics 11 (18), 2832, 2022 | 1 | 2022 |
| Variability-aware MMIC design through multiphysics modelling SD Guerrieri, C Ramella, E Catoggio, F Bonani 2022 IEEE MTT-S International Conference on Numerical Electromagnetic and …, 2022 | 1 | 2022 |
| Efficient TCAD temperature-dependent large-signal simulation of a FinFET power amplifier E Catoggio, SD Guerrieri, F Bonani, G Ghione 2021 16th European Microwave Integrated Circuits Conference (EuMIC), 189-192, 2022 | 1 | 2022 |
| TCAD Analysis of GaN HEMT Output Conductance Through Trap Rate Equation Green’s Functions E Catoggio, SD Guerrieri, F Bonani 2023 International Workshop on Integrated Nonlinear Microwave and Millimetre …, 2023 | | 2023 |
| GaN HEMT trap-induced variability through concurrent noise and AC TCAD modelling E Catoggio, SD Guerrieri, F Bonani 2023 International Conference on Noise and Fluctuations (ICNF), 1-4, 2023 | | 2023 |
| TCAD analysis of GaN HEMT AC parameters through accurate solution of trap rate equations E Catoggio, SD Guerrieri, F Bonani 2023 18th European Microwave Integrated Circuits Conference (EuMIC), 33-36, 2023 | | 2023 |
| Multibias TCAD Analysis of Trap Dynamics in GaN HEMTs E Catoggio, S Donati Guerrieri, F Bonani Annual Meeting of the Italian Electronics Society, 102-109, 2023 | | 2023 |
| TCAD assisted design of the Doherty Power Amplifier SD Guerrieri, E Catoggio, F Bonani Solid-State Electronics 207, 108684, 2023 | | 2023 |
| Spatial distribution of microwave device harmonic electrical variables through T-dependent TCAD simulations E Catoggio, SD Guerrieri, F Bonani, G Ghione IEEE EUROCON 2023-20th International Conference on Smart Technologies, 552-557, 2023 | | 2023 |
| Synergic Exploitation of TCAD and Deep Neural Networks for Nonlinear FinFET Modeling L Kouhalvandi, E Catoggio, SD Guerrieri IEEE EUROCON 2023-20th International Conference on Smart Technologies, 542-546, 2023 | | 2023 |
| Advanced modeling of nanoscale devices for analog applications E Catoggio Politecnico di Torino, 2023 | | 2023 |
| Multi-bias Thermal X-Parameter Model for Efficient Physics-Based FinFET Simulation in RF CAD Tools E Catoggio, S Donati Guerrieri, C Ramella, F Bonani Annual Meeting of the Italian Electronics Society, 43-49, 2022 | | 2022 |
| Efficient TCAD Large-Signal temperature-dependent variability analysis of a FinFET power amplifier E Catoggio, SD Guerrieri, F Bonani, G Ghione 2021 International Conference on Simulation of Semiconductor Processes and …, 2021 | | 2021 |
