| Influence of Metal–MoS2 Interface on MoS2 Transistor Performance: Comparison of Ag and Ti Contacts H Yuan, G Cheng, L You, H Li, H Zhu, W Li, JJ Kopanski, YS Obeng, ... ACS applied materials & interfaces 7 (2), 1180-1187, 2015 | 123 | 2015 |
| Microwave-based metrology platform development: application of broad-band RF metrology to integrated circuit reliability analyses L You, CA Okoro, JJ Ahn, JJ Kopanski, YS Obeng ECS Transactions 61 (6), 113, 2014 | 68* | 2014 |
| Subsurface imaging of metal lines embedded in a dielectric with a scanning microwave microscope L You, JJ Ahn, YS Obeng, JJ Kopanski Journal of Physics D: Applied Physics 49 (4), 045502, 2015 | 25 | 2015 |
| Electronic properties and structure of single crystal perylene SJ Pookpanratana, KP Goetz, EG Bittle, H Haneef, L You, CA Hacker, ... Organic electronics 61, 157-163, 2018 | 20 | 2018 |
| Scanning probe microscopes for subsurface imaging JJ Kopanski, L You, JJ Ahn, E Hitz, YS Obeng ECS Transactions 61 (2), 185, 2014 | 18* | 2014 |
| Contrasting Transport and Electrostatic Properties of Selectively Fluorinated Alkanethiol Monolayers with Embedded Dipoles RC Bruce, L You, A Förster, S Pookpanratana, O Pomerenk, HJ Lee, ... The Journal of Physical Chemistry C 122 (9), 4881-4890, 2018 | 16 | 2018 |
| Broadband microwave-based metrology platform development: demonstration of in-situ failure mode diagnostic capabilities for integrated circuit reliability analyses L You, CA Okoro, JJ Ahn, J Kopanski, RR Franklin, YS Obeng ECS Journal of Solid State Science and Technology 4 (1), N3113, 2014 | 10 | 2014 |
| SnTe field effect transistors and the anomalous electrical response of structural phase transition H Li, H Zhu, H Yuan, L You, CA Richter, JJ Kopanski, E Zhao, Q Li Applied Physics Letters 105 (1), 2014 | 8 | 2014 |
| Dielectric spectroscopic detection of early failures in 3-D integrated circuits YS Obeng, CA Okoro, JJ Ahn, L You, JJ Kopanski ECS transactions 69 (6), 69, 2015 | 6 | 2015 |
| Probe assisted localized doping of aluminum into silicon substrates JJ Ahn, SD Solares, L You, H Noh, J Kopanski, Y Obeng Journal of Applied Physics 125 (7), 2019 | 3 | 2019 |
| Broadband Spectroscopic Characterization of Electrically Active Defects in Dielectrics: Monitoring the in-Service Evolution of Dialectics in Integrated System YS Obeng, CA Okoro, PK Amoah, L You ECS Transactions 72 (2), 123, 2016 | 2 | 2016 |
| Electromagnetic field test structure chip for back end of the line metrology L You, JJ Ahn, E Hitz, J Michelson, Y Obeng, J Kopanski Proceedings of the 2015 International Conference on Microelectronic Test …, 2015 | 2 | 2015 |
| Broadband Spectroscopic Characterization of Hybrid Low-k Dielectric Thin Films for Micro-and Nanoelectronic Applications YS Obeng, CA Okoro, KR Montgomery, PK Amoah, L You, JJ Kopanski, ... ECS Transactions 75 (5), 199, 2016 | 1 | 2016 |
| The Protocol Of KFM Characterization On Cross‐section Of CdS/CdTe Thin Film Solar Cell L You, N Chevalier, S Bernardi, E Martinez, D Mariolle, G Feuillet, ... AIP Conference Proceedings 1395 (1), 118-122, 2011 | 1 | 2011 |
| Die-Level Micrometers-Deep Subsurface Imaging for Fault Isolation Using Remote Bias Induced Electrostatic Force Microscopy E Strelcov, L You, Y Obeng, JJ Kopanski ISTFA 2022, 426-433, 2022 | | 2022 |
| Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems PK Amoah, CE Sunday, C Okoro, J Ahn, L You, D Veksler, J Kopanski, ... ECS Transactions 109 (2), 41, 2022 | | 2022 |
| Electric Field Gradient Reference Material for Scanning Probe Microscopy J Kopanski, L You Proceedings of the 2019 International Conference on Frontiers of …, 2019 | | 2019 |
| Subsurface imaging of biased structures with electrostatic force microscopy (EFM) L You, YS Obeng, J Kopanski Lin You, Yaw S. Obeng, Joseph Kopanski, 2018 | | 2018 |
| Method for Determining the Electrical Shape of a Scanning Probe Microscope Tip JJ Kopanski, M Regan, L You Joseph J. Kopanski, Malcolm Regan, Lin You, 2018 | | 2018 |
| Impact of fluorinated alkanethiols with embedded dipoles on transport properties of EGaIn top contact devices and organic transistors R Bruce, L You, L Fredin, A Foerster, E Bittle, D Vang, S Pookpanratana, ... ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 255, 2018 | | 2018 |
Y. S. ObengNISTEmail verificata su nist.gov
