Wangyang (Lucas) Zhang
Wangyang (Lucas) Zhang
Cadence Design Systems, Pittsburgh, PA
Verified email at cadence.com - Homepage
TitleCited byYear
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data
F Wang, W Zhang, S Sun, X Li, C Gu
Proceedings of the 50th Annual Design Automation Conference, 64, 2013
522013
Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits
W Zhang, X Li, F Liu, E Acar, RA Rutenbar, RD Blanton
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2011
472011
Test cost reduction through performance prediction using virtual probe
HM Chang, KT Cheng, W Zhang, X Li, KM Butler
International Test Conference (ITC), 2011 IEEE, 1-9, 2011
392011
Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference
W Zhang, X Li, RA Rutenbar
Design Automation Conference (DAC), 2010 47th ACM/IEEE, 262-267, 2010
352010
Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion
X Li, W Zhang, F Wang, S Sun, C Gu
Proceedings of the International Conference on Computer-Aided Design, 627-634, 2012
312012
An efficient method for chip-level statistical capacitance extraction considering process variations with spatial correlation
W Zhang, W Yu, Z Wang, Z Yu, R Jiang, J Xiong
2008 Design, Automation and Test in Europe, 580-585, 2008
302008
Test Data Analytics—Exploring Spatial and Test-Item Correlations in Production Test Data
CK Hsu, F Lin, KT Cheng, W Zhang, X Li, JM Carulli Jr, KM Butler
International Test Conference (ITC), 2013 IEEE, 2013
292013
Multi-wafer virtual probe: minimum-cost variation characterization by exploring wafer-to-wafer correlation
W Zhang, X Li, E Acar, F Liu, R Rutenbar
Proceedings of the International Conference on Computer-Aided Design, 47-54, 2010
282010
Variational capacitance extraction of on-chip interconnects based on continuous surface model
W Yu, C Hu, W Zhang
Proceedings of the 46th Annual Design Automation Conference, 758-763, 2009
282009
Automatic clustering of wafer spatial signatures
W Zhang, X Li, S Saxena, A Strojwas, R Rutenbar
Proceedings of the 50th Annual Design Automation Conference, 71, 2013
222013
Efficient spatial pattern analysis for variation decomposition via robust sparse regression
W Zhang, K Balakrishnan, X Li, DS Boning, S Saxena, A Strojwas, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
162013
Large-scale statistical performance modeling of analog and mixed-signal circuits
X Li, W Zhang, F Wang
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 1-8, 2012
142012
Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression
W Zhang, TH Chen, MY Ting, X Li
Proceedings of the 47th Design Automation Conference, 897-902, 2010
142010
Parallel statistical capacitance extraction of on-chip interconnects with an improved geometric variation model
W Yu, C Hu, W Zhang
16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011), 67-72, 2011
132011
Toward efficient spatial variation decomposition via sparse regression
W Zhang, K Balakrishnan, X Li, D Boning, R Rutenbar
Proceedings of the International Conference on Computer-Aided Design, 162-169, 2011
122011
Parallel extraction of worst case corners
H Liu, W Zhang
US Patent App. 10/289,764, 2019
102019
Device mismatch contribution computation with nonlinear effects
H Liu, W Zhang
US Patent 8,954,910, 2015
52015
A dynamic method for efficient random mismatch characterization of standard cells
W Zhang, A Singhee, J Xiong, P Habitz, A Joshi, C Visweswariah, ...
Proceedings of the International Conference on Computer-Aided Design, 180-186, 2012
42012
Computing device mismatch variation contributions
H Liu, W Zhang
US Patent 8,813,009, 2014
22014
IC Spatial Variation Modeling: Algorithms and Applications
W Zhang
Carnegie Mellon University, 2012
22012
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