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Michael A McGuireOak Ridge National LaboratoryEmail verificata su ornl.gov
Bryan ChakoumakosCorporate Fellow, Oak Ridge National LaboratoryEmail verificata su ornl.gov
Lynn A BoatnerDirector, ORNL Center for Radiation Detection Materials and SystemsEmail verificata su ornl.gov
J.-Q. YanOak Ridge National LaboratoryEmail verificata su utk.edu
Mark LumsdenOak Ridge National LaboratoryEmail verificata su ornl.gov
David J. SinghUniversity of MissouriEmail verificata su missouri.edu
Andrew ChristiansonSenior Scientist Oak Ridge National LaboratoryEmail verificata su ornl.gov
Stephen E NaglerORNL - UTKEmail verificata su ornl.gov
M. Brian MapleProfessor of Physics, UC San DiegoEmail verificata su physics.ucsd.edu
Andrew F. MayResearch scientist, Oak Ridge National LabEmail verificata su ornl.gov
Olivier DelaireDuke UniversityEmail verificata su duke.edu
M P ParanthamanCorporate FellowEmail verificata su ornl.gov
Huibo CaoOak Ridge National LaboratoryEmail verificata su ornl.gov
David ParkerOak Ridge National LaboratoryEmail verificata su ornl.gov
Raphael HermannOak Ridge National LaboratoryEmail verificata su ornl.gov
Wei TianStaff Scientist, Oak Ridge National LaboratoryEmail verificata su ornl.gov
Takeshi EgamiProfessor of Materials Science and Physics, University of TennesseeEmail verificata su utk.edu
Manuel AngstForschungszentrum Juelich GmbHEmail verificata su fz-juelich.de
Claudia CantoniOak Ridge National LaboratoryEmail verificata su ornl.gov
H. BEIZhejiang UniversityEmail verificata su zju.edu.cn