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- Wayne JohnsonSoundside Partners LLCEmail verificata su soundsidepartners.com
- Fan RenUniversity of Florida, Bell Lab, AT&TEmail verificata su che.ufl.edu
- Salah BedairNorth Carolina State UnversityEmail verificata su ncsu.edu
- Stephen PeartonProfessor of Materials Science and Engineering, University of FloridaEmail verificata su mse.ufl.edu
- Sameer SinghalDirector, CFD Research CorpEmail verificata su cfdrc.com
- Mark Holtz, Ph.D.Texas State UniversityEmail verificata su txstate.edu
- Andrei VescanRWTH AachenEmail verificata su cst.rwth-aachen.de
- K.S. BoutrosEmail verificata su hrl.com
- Tomás PalaciosMITEmail verificata su mit.edu
- Brent P. GilaUniversity of FloridaEmail verificata su ufl.edu
- Byung-Hwan ChuIBM, Samsung, U or FloridaEmail verificata su ufl.edu
- J. W. ChungSamsung ElectronicsEmail verificata su samsung.com
- M.NazariVisiting Scholar, Texas State UniversityEmail verificata su txstate.edu
- Joan RedwingPenn State UniversityEmail verificata su psu.edu
- Raju Ahmed, Ph. D.Sr R&D Engineer at Micron TechnologyEmail verificata su micron.com
- Isik KizilyalliARPA-e, U.S.Department of EnergyEmail verificata su hq.doe.gov
- Cammy R AbernathyUniversity of FloridaEmail verificata su eng.ufl.edu
- Yiider TsengProfessor of Chemical Engineering, University of FloridaEmail verificata su ufl.edu
- Anwar SiddiqueProduct Engineer, Intel CorpEmail verificata su intel.com
- Samuel GrahamUniversity of MarylandEmail verificata su umd.edu