Amith Singhee
Amith Singhee
Research Staff Member, IBM Thomas J. Watson Research Center
Verified email at us.ibm.com
TitleCited byYear
Why quasi-monte carlo is better than monte carlo or latin hypercube sampling for statistical circuit analysis
A Singhee, RA Rutenbar
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
1492010
Statistical blockade: Very fast statistical simulation and modeling of rare circuit events and its application to memory design
A Singhee, RA Rutenbar
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009
1442009
Remembrance of circuits past: macromodeling by data mining in large analog design spaces
H Liu, A Singhee, RA Rutenbar, LR Carley
Design Automation Conference, 2002. Proceedings. 39th, 437-442, 2002
1362002
Statistical blockade: a novel method for very fast Monte Carlo simulation of rare circuit events, and its application
A Singhee, RA Rutenbar
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
1262007
Practical, fast Monte Carlo statistical static timing analysis: why and how
A Singhee, S Singhal, RA Rutenbar
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided …, 2008
702008
Practical, fast Monte Carlo statistical static timing analysis: why and how
A Singhee, S Singhal, RA Rutenbar
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided …, 2008
702008
From finance to flip flops: A study of fast quasi-Monte Carlo methods from computational finance applied to statistical circuit analysis
A Singhee, RA Rutenbar
8th International Symposium on Quality Electronic Design (ISQED'07), 685-692, 2007
692007
Recursive statistical blockade: An enhanced technique for rare event simulation with application to SRAM circuit design
A Singhee, J Wang, BH Calhoun, RA Rutenbar
21st International Conference on VLSI Design (VLSID 2008), 131-136, 2008
652008
Statistical modeling for the minimum standby supply voltage of a full SRAM array
J Wang, A Singhee, RA Rutenbar, BH Calhoun
ESSCIRC 2007-33rd European Solid-State Circuits Conference, 400-403, 2007
622007
Beyond low-order statistical response surfaces: latent variable regression for efficient, highly nonlinear fitting
A Singhee, RA Rutenbar
2007 44th ACM/IEEE Design Automation Conference, 256-261, 2007
502007
Novel algorithms for fast statistical analysis of scaled circuits
A Singhee, RA Rutenbar
Springer Science & Business Media, 2009
342009
Computational needs for the next generation electric grid
JH Eto, RJ Thomas
Department of Energy 593, 2011
28*2011
Extreme statistics in nanoscale memory design
A Singhee, RA Rutenbar
Springer Science & Business Media, 2010
242010
Two fast methods for estimating the minimum standby supply voltage for large SRAMs
J Wang, A Singhee, RA Rutenbar, BH Calhoun
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
232010
Probabilistic interval-valued computation: toward a practical surrogate for statistics inside cad tools
A Singhee, CF Fang, JD Ma, RA Rutenbar
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
212008
Method and apparatus for sampling and predicting rare events in complex electronic devices, circuits and systems
A Singhee, R Rutenbar
US Patent 8,155,938, 2012
192012
Yield estimation of SRAM circuits using virtual SRAM fab
A Bansal, RN Singh, RN Kanj, S Mukhopadhyay, JF Lee, E Acar, ...
Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009
142009
A Simulation Study of Oxygen Vacancy-Induced Variability in /Metal Gated SOI FinFET
AR Trivedi, T Ando, A Singhee, P Kerber, E Acar, DJ Frank, ...
IEEE Transactions on Electron Devices 61 (5), 1262-1269, 2014
122014
Stream computing based synchrophasor application for power grids
J Hazra, K Das, DP Seetharam, A Singhee
Proceedings of the first international workshop on High performance …, 2011
122011
Exploiting correlation kernels for efficient handling of intra-die spatial correlation, with application to statistical timing
A Singhee, S Singhal, RA Rutenbar
Proceedings of the conference on Design, automation and test in Europe, 856-861, 2008
122008
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