Evan M Anderson
Titolo
Citata da
Citata da
Anno
The influence of growth temperature on Sb incorporation in InAsSb, and the temperature-dependent impact of Bi surfactants
WL Sarney, SP Svensson, EM Anderson, AM Lundquist, C Pearson, ...
Journal of crystal growth 406, 8-11, 2014
152014
Atomic Precision Advanced Manufacturing for Digital Electronics
DR Ward, SW Schmucker, EM Anderson, E Bussmann, L Tracy, TM Lu, ...
Electronic Device Failure Analysis 22 (1), 4-10, 2020
122020
Influence of a Bi surfactant on Sb incorporation in InAsSb alloys
EM Anderson, AM Lundquist, WL Sarney, SP Svensson, PJ Carrington, ...
Journal of Applied Physics 116 (1), 014901, 2014
92014
Incorporation kinetics in mixed anion compound semiconductor alloys
JM Millunchick, EM Anderson, C Pearson, WL Sarney, SP Svensson
Journal of Applied Physics 114 (23), 234907, 2013
92013
Low thermal budget high-k/metal surface gate for buried donor-based devices
EM Anderson, DAM Campbell, LN Maurer, AD Baczewski, MT Marshall, ...
Journal of Physics: Materials 3 (3), 035002, 2020
42020
The atomistic mechanism for Sb segregation and As displacement of Sb in InSb (001) surfaces
EM Anderson, JM Millunchick
Surface Science 667, 45-53, 2018
42018
Assessing atomically thin delta-doping of silicon using mid-infrared ellipsometry
AM Katzenmeyer, TS Luk, E Bussmann, S Young, EM Anderson, ...
Journal of Materials Research 35 (16), 2098-2105, 2020
32020
Resonant ultrathin infrared detectors enabling high quantum efficiency
DW Peters, MD Goldflam, S Campione, PS Finnegan, JK Kim, MB Sinclair, ...
2018 IEEE Research and Applications of Photonics In Defense Conference …, 2018
32018
Photothermal alternative to device fabrication using atomic precision advanced manufacturing techniques
AM Katzenmeyer, S Dmitrovic, AD Baczewski, E Bussmann, TM Lu, ...
Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020 …, 2020
22020
Surface intermixing by atomic scale roughening in Sb-terminated InAs
EM Anderson, AM Lundquist, C Pearson, JM Millunchick
Journal of Applied Physics 121 (9), 095301, 2017
22017
Growth temperature and surfactant effects on the properties of mixed group V alloys
SP Svensson, WL Sarney, BC Connelly, EM Anderson, JM Millunchick
Journal of Crystal Growth 425, 234-236, 2015
22015
Monolithically fabricated tunable long-wave infrared detectors based on dynamic graphene metasurfaces
MD Goldflam, I Ruiz, SW Howell, A Tauke-Pedretti, EM Anderson, ...
Applied Physics Letters 116 (19), 191102, 2020
12020
Low-temperature silicon epitaxy for atomic precision devices
EM Anderson, AM Katzenmeyer, TS Luk, DAM Campbell, MT Marshall, ...
ECS Transactions 93 (1), 37, 2019
12019
Interactions between Sb and As on InAs (0 0 1) surfaces
EM Anderson, JM Millunchick
Journal of Crystal Growth 500, 68-73, 2018
12018
Microwave Based Lifetime Measurements and Analysis for Detector Materials.
EA Shaner, CN Kadlec, M Goldflam, ES Bielejec, P Webster, ...
Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2018
12018
Reduced temperature preparation of atomically clean Si surfaces to augment CMOS with atomic precision devices
E Anderson, L Pena, J Mudrick, DA Campbell, A Katzenmeyer, L Tracy, ...
Bulletin of the American Physical Society, 2021
2021
Room Temperature Operation of Donor-Based Atomically Precise Devices
J Ivie, L Tracy, J Mendez, S Gao, E Anderson, S Schmucker, DA Campbell, ...
Bulletin of the American Physical Society, 2021
2021
Photothermal alternative to device fabrication using atomic precision advanced manufacturing techniques
AM Katzenmeyer, S Dmitrovic, AD Baczewski, Q Campbell, E Bussmann, ...
Journal of Micro/Nanopatterning, Materials, and Metrology 20 (1), 014901, 2021
2021
Reaction of Bis (pinacolato) diboron with H-Si (100): The Pursuit of On-surface Hydrosilane Borylation Reactions
E Frederick, I Kolesnichenko, Q Campbell, LF Peña, A Benavidez, ...
2021
Accessing Atomic-scale Phosphorus Dopant Distribution in Precise Silicon Devices by Advanced STEM Imaging and Spectroscopy
P Lu, E Anderson, S Schmucker, F Pena, E Frederick, J Ivie, E Bussmann, ...
Microscopy and Microanalysis 26 (S2), 1516-1517, 2020
2020
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