Patrick Heymans
Titolo
Citata da
Citata da
Anno
Feature diagrams: A survey and a formal semantics
PY Schobbens, P Heymans, JC Trigaux
14th IEEE International Requirements Engineering Conference (RE'06), 139-148, 2006
5462006
Generic semantics of feature diagrams
PY Schobbens, P Heymans, JC Trigaux, Y Bontemps
Computer networks 51 (2), 456-479, 2007
4692007
Model checking lots of systems: efficient verification of temporal properties in software product lines
A Classen, P Heymans, PY Schobbens, A Legay, JF Raskin
Proceedings of the 32nd ACM/IEEE International Conference on Software …, 2010
3552010
A proposal for a scenario classification framework
C Rolland, CB Achour, C Cauvet, J Ralyté, A Sutcliffe, N Maiden, M Jarke, ...
Requirements Engineering 3 (1), 23-47, 1998
3411998
Disambiguating the documentation of variability in software product lines: A separation of concerns, formalization and automated analysis
A Metzger, K Pohl, P Heymans, PY Schobbens, G Saval
15th IEEE International Requirements Engineering Conference (RE 2007), 243-253, 2007
2992007
Symbolic model checking of software product lines
A Classen, P Heymans, PY Schobbens, A Legay
Proceedings of the 33rd International Conference on Software Engineering …, 2011
2552011
What’s in a Feature: A Requirements Engineering Perspective
A Classen, P Heymans, PY Schobbens
International Conference on Fundamental Approaches to Software Engineering …, 2008
2142008
Featured transition systems: Foundations for verifying variability-intensive systems and their application to LTL model checking
A Classen, M Cordy, PY Schobbens, P Heymans, A Legay, JF Raskin
IEEE Transactions on Software Engineering 39 (8), 1069-1089, 2012
2122012
A text-based approach to feature modelling: Syntax and semantics of TVL
A Classen, Q Boucher, P Heymans
Science of Computer Programming 76 (12), 1130-1143, 2011
2102011
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
1712014
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
1712014
Analysing the cognitive effectiveness of the BPMN 2.0 visual notation
N Genon, P Heymans, D Amyot
International conference on software language engineering, 377-396, 2010
1682010
On extracting feature models from product descriptions
M Acher, A Cleve, G Perrouin, P Heymans, C Vanbeneden, P Collet, ...
Proceedings of the Sixth International Workshop on Variability Modeling of …, 2012
1612012
Visual syntax does matter: improving the cognitive effectiveness of the i* visual notation
DL Moody, P Heymans, R Matulevičius
Requirements Engineering 15 (2), 141-175, 2010
1602010
A systematic approach to define the domain of information system security risk management
É Dubois, P Heymans, N Mayer, R Matulevičius
Intentional Perspectives on Information Systems Engineering, 289-306, 2010
1582010
Feature model extraction from large collections of informal product descriptions
JM Davril, E Delfosse, N Hariri, M Acher, J Cleland-Huang, P Heymans
Proceedings of the 2013 9th Joint Meeting on Foundations of Software …, 2013
1392013
Semantics of FODA feature diagrams
Y Bontemps, P Heymans, PY Schobbens, JC Trigaux
Proceedings SPLC 2004 Workshop on Software Variability Management for …, 2004
1052004
Model checking software product lines with SNIP
A Classen, M Cordy, P Heymans, A Legay, PY Schobbens
International Journal on Software Tools for Technology Transfer 14 (5), 589-612, 2012
1032012
Improving the effectiveness of visual representations in requirements engineering: An evaluation of i* visual syntax
DL Moody, P Heymans, R Matulevicius
2009 17th IEEE International Requirements Engineering Conference, 171-180, 2009
1012009
Alignment of misuse cases with security risk management
R Matulevicius, N Mayer, P Heymans
2008 Third International Conference on Availability, Reliability and …, 2008
1012008
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20