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Thomas Schilles
Thomas Schilles
Unknown affiliation
Verified email at schilles.de
Title
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Cited by
Year
A multi-spectroscopic study of luminescence sensitivity changes in natural quartz induced by high-temperature annealing
T Schilles, NRJ Poolton, E Bulur, L Bøtter-Jensen, AS Murray, GM Smith, ...
Journal of Physics D: Applied Physics 34 (5), 722, 2001
932001
Steps towards surface dating using luminescence
J Habermann, T Schilles, R Kalchgruber, GA Wagner
Radiation Measurements 32 (5-6), 847-851, 2000
802000
Point defects and the blue emission in fired quartz at high doses: a comparative luminescence and EPR study
C Woda, T Schilles, U Riser, A Mangini, G A. Wagner
Radiation protection dosimetry 100 (1-4), 261-264, 2002
262002
Radioluminescence dating: the IR emission of feldspar
T Schilles, J Habermann
Radiation measurements 32 (5-6), 679-683, 2000
162000
Die Infrarot-Radiolumineszenz von Feldspäten und ihr Einsatz in der Lumineszenzdatierung
T Schilles
92001
Improved single aliquot dating applications using a new highly efficient modular luminescence reader
T Schilles, A Lang, J Habermann, U Riser
Radiation protection dosimetry 84, 1999
41999
APPLIED INTERFACES AND SURFACES-A multi-spectroscopic study of luminescence sensitivity changes in natural quartz induced by high-temperature annealing
T Schilles, NRJ Poolton, E Bulur, L Botter-Jensen, AS Murray, GM Smith, ...
Journal of Physics D-Applied Physics 34 (5), 722-731, 2001
2001
Basic properties of surface dating using luminescence
J Habermann, R Kalchgruber, T Schilles, GA Wagner
2000
Investigations on feldspar IR-Radioluminescence
T Schilles, J Habermann, GA Wagner
2000
Basic properties of surface dating using luminescence
J Habermann, R Kalchgruber, T Schilles, GA Wagner
2000
The authors thank Prof. GA Wagner for his interest and support. They are grateful to an anonymous reviewer
T SCHILLES, A LANG, J HABERMANN, U RIESER
Solid State Dosimetry: Proceedings of the 12th International Conference on …, 1999
1999
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